Antisolvent processing of lead halide perovskite thin films studied by in situ X-ray diffraction

Bruening, Karsten; Tassone, Christopher J.

doi:10.1039/c8ta06025h

Title: Antisolvent processing of lead halide perovskite thin films studied by in situ X-ray diffraction

Abstract

The conversion mechanism from the precursor ink to the perovskite film using antisolvent-induced crystallization has been studied usingin situX-ray diffraction during blade coating and antisolvent deposition.

Authors:

^[1]; Tassone, Christopher J. ^[1]

SLAC National Accelerator Lab., Menlo Park, CA (United States)

Publication Date:: 2018-09-25

Research Org.:: SLAC National Accelerator Lab., Menlo Park, CA (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1490882

Alternate Identifier(s):: OSTI ID: 1474756; OSTI ID: 1491404

Grant/Contract Number:: ECCS-1542152; AC02-76SF00515

Resource Type:: Accepted Manuscript

Journal Name:: Journal of Materials Chemistry. A

Additional Journal Information:: Journal Volume: 6; Journal Issue: 39; Journal ID: ISSN 2050-7488

Publisher:: Royal Society of Chemistry

Country of Publication:: United States

Language:: English

Subject:: 37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY

Citation Formats


                    Bruening, Karsten, and Tassone, Christopher J. Antisolvent processing of lead halide perovskite thin films studied by in situ X-ray diffraction.  United States: N. p., 2018. 
Web.  doi:10.1039/c8ta06025h.

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                    Bruening, Karsten, & Tassone, Christopher J. Antisolvent processing of lead halide perovskite thin films studied by in situ X-ray diffraction.  United States.  https://doi.org/10.1039/c8ta06025h

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                    Bruening, Karsten, and Tassone, Christopher J. Tue .  
"Antisolvent processing of lead halide perovskite thin films studied by in situ X-ray diffraction".  United States.  https://doi.org/10.1039/c8ta06025h.  https://www.osti.gov/servlets/purl/1490882.

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@article{osti_1490882,

  title        = {Antisolvent processing of lead halide perovskite thin films studied by in situ X-ray diffraction},

  author       = {Bruening, Karsten and Tassone, Christopher J.},

  abstractNote = {The conversion mechanism from the precursor ink to the perovskite film using antisolvent-induced crystallization has been studied usingin situX-ray diffraction during blade coating and antisolvent deposition.},

  doi          = {10.1039/c8ta06025h},

  journal      = {Journal of Materials Chemistry. A},

  number       = 39,

  volume       = 6,

  place        = {United States},

  year         = {2018},

  month        = {9}

}

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https://doi.org/10.1039/c8ta06025h

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Cited by: 2 works

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Fig. 1: Experimental setup and observation of phase transitions of blade coated films during drying. (a) Schematic of blade coating setup with in situ X-ray diffraction. (b–d) [(b) DMF, (c) NMP, (d) DMSO] evolution of film thickness (blue dots), integrated crystalline intermediate XRD signal (a.u., red squares), integrated perovskite XRDmore »

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Title: Antisolvent processing of lead halide perovskite thin films studied by in situ X-ray diffraction

Abstract

Citation Formats

Figures / Tables:

The fast azimuthal integration Python library: pyFAI journal, March 2015

Coordination Chemistry Dictates the Structural Defects in Lead Halide Perovskites journal, July 2016

The mechanism of toluene-assisted crystallization of organic–inorganic perovskites for highly efficient solar cells journal, January 2016

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