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Title: Antisolvent processing of lead halide perovskite thin films studied by in situ X-ray diffraction

Abstract

Here, whe conversion mechanism from the precursor ink to the perovskite film using antisolvent-induced crystallization has been studied using in situ X-ray diffraction during blade coating and antisolvent deposition. We study various solvent systems forming methylammonium lead iodide perovskite. We find that it is critical to add the antisolvent before the formation of a crystalline intermediate phase. Compared to thermal crystallization, the antisolvent-induced crystallization alters the conversion route. Instead of heterogeneous nucleation and conversion through a crystalline intermediate phase, antisolvent-assisted annealing leads to a rapid direct crystallization, resulting in highly regular smooth films.

Authors:
ORCiD logo [1];  [1]
  1. SLAC National Accelerator Lab., Menlo Park, CA (United States)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1490882
Alternate Identifier(s):
OSTI ID: 1474756; OSTI ID: 1491404
Grant/Contract Number:  
[ECCS-1542152; AC02-76SF00515]
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Materials Chemistry. A
Additional Journal Information:
[ Journal Volume: 6; Journal Issue: 39]; Journal ID: ISSN 2050-7488
Publisher:
Royal Society of Chemistry
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY

Citation Formats

Bruening, Karsten, and Tassone, Christopher J. Antisolvent processing of lead halide perovskite thin films studied by in situ X-ray diffraction. United States: N. p., 2018. Web. doi:10.1039/c8ta06025h.
Bruening, Karsten, & Tassone, Christopher J. Antisolvent processing of lead halide perovskite thin films studied by in situ X-ray diffraction. United States. doi:10.1039/c8ta06025h.
Bruening, Karsten, and Tassone, Christopher J. Tue . "Antisolvent processing of lead halide perovskite thin films studied by in situ X-ray diffraction". United States. doi:10.1039/c8ta06025h. https://www.osti.gov/servlets/purl/1490882.
@article{osti_1490882,
title = {Antisolvent processing of lead halide perovskite thin films studied by in situ X-ray diffraction},
author = {Bruening, Karsten and Tassone, Christopher J.},
abstractNote = {Here, whe conversion mechanism from the precursor ink to the perovskite film using antisolvent-induced crystallization has been studied using in situ X-ray diffraction during blade coating and antisolvent deposition. We study various solvent systems forming methylammonium lead iodide perovskite. We find that it is critical to add the antisolvent before the formation of a crystalline intermediate phase. Compared to thermal crystallization, the antisolvent-induced crystallization alters the conversion route. Instead of heterogeneous nucleation and conversion through a crystalline intermediate phase, antisolvent-assisted annealing leads to a rapid direct crystallization, resulting in highly regular smooth films.},
doi = {10.1039/c8ta06025h},
journal = {Journal of Materials Chemistry. A},
number = [39],
volume = [6],
place = {United States},
year = {2018},
month = {9}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

Citation Metrics:
Cited by: 2 works
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Figures / Tables:

Fig. 1 Fig. 1: Experimental setup and observation of phase transitions of blade coated films during drying. (a) Schematic of blade coating setup with in situ X-ray diffraction. (b–d) [(b) DMF, (c) NMP, (d) DMSO] evolution of film thickness (blue dots), integrated crystalline intermediate XRD signal (a.u., red squares), integrated perovskite XRDmore » signal (a.u., black circles), film color (red channel on ordinate, curve plotted in actual film color) over time (after blade coating) during drying at room temperature. The time window for optimum antisolvent deposition is indicated in green.« less

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