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Title: Nano-machining, surface analysis and emittance measurements of a copper photocathode at SPARC_LAB

Abstract

R&D activity on Cu photocathodes is under development at the SPARC_LAB test facility to fully characterize each stage of the photocathode “life” and to have a complete overview of the photoemission properties in high brightness photo-injectors. The nano(n)-machining process presented here consists in diamond milling, and blowing with dry nitrogen. This procedure reduces the roughness of the cathode surface and prevents surface contamination introduced by other techniques, such as polishing with diamond paste or the machining with oil. Both high roughness and surface contamination cause an increase of intrinsic emittance and consequently a reduction of the overall electron beam brightness. To quantify these effects, we have characterized the photocathode surface in terms of roughness measurement, and morphology and chemical composition analysis by means of Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS), and Atomic Force Microscopy (AFM) techniques. The effects of n-machining on the electron beam quality have been also investigated through emittance measurements before and after the surface processing technique. Finally, we present preliminary emittance studies of yttrium thin film on Cu photocathodes.

Authors:
 [1];  [2];  [2];  [2];  [2];  [2];  [2];  [2];  [2];  [3];  [2];  [2];  [2];  [2];  [4];  [2];  [2];  [5];  [6];  [7] more »;  [7];  [8];  [2];  [2];  [2];  [2];  [9];  [2] « less
  1. Lab. Nazionali di Frascati, Roma (Italy)
  2. Lab. Nazionali di Frascati, Roma (Italy
  3. Univ. degli Studi di Roma Tor Vergata (Italy)
  4. SLAC National Accelerator Lab., Menlo Park, CA (United States)
  5. Univ. del Salento, Lecce (Italy). Dipt. di Matematica e Fisica E. De Giorgi
  6. Lab. Nazionali di Frascati, Roma (Italy); Univ. degi Studi di Chieti e Pescara, Chieti (Italy). Dipartimento di Neuroscienze, Immaging e Scienze Cliniche Via dei Vestini
  7. SBAI-Univ. di Roma “La Sapienza”, Roma (Italy)
  8. Univ. del Salento, Lecce (Italy). Dipartimento di Matematica e Fisica E. De Giorgi
  9. Elettra-Sincrotrone Trieste SCpA, Trieste (Italy)
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1490679
Grant/Contract Number:  
653782; AC02-76SF00515
Resource Type:
Accepted Manuscript
Journal Name:
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Additional Journal Information:
Journal Volume: 909; Journal Issue: C; Journal ID: ISSN 0168-9002
Publisher:
Elsevier
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; Photocathode; Roughness; Emittance

Citation Formats

Scifo, J., Alesini, D., Anania, M. P., Bellaveglia, M., Bellucci, S., Biagioni, A., Bisesto, F., Cardelli, F., Chiadroni, E., Cianchi, A., Costa, G., Di Giovenale, D., Di Pirro, G., Di Raddo, R., Dowell, D. H., Ferrario, M., Giribono, A., Lorusso, A., Micciulla, F., Mostacci, A., Passeri, D., Perrone, A., Piersanti, L., Pompili, R., Shpakov, V., Stella, A., Trovò, M., and Villa, F. Nano-machining, surface analysis and emittance measurements of a copper photocathode at SPARC_LAB. United States: N. p., 2018. Web. doi:10.1016/j.nima.2018.01.041.
Scifo, J., Alesini, D., Anania, M. P., Bellaveglia, M., Bellucci, S., Biagioni, A., Bisesto, F., Cardelli, F., Chiadroni, E., Cianchi, A., Costa, G., Di Giovenale, D., Di Pirro, G., Di Raddo, R., Dowell, D. H., Ferrario, M., Giribono, A., Lorusso, A., Micciulla, F., Mostacci, A., Passeri, D., Perrone, A., Piersanti, L., Pompili, R., Shpakov, V., Stella, A., Trovò, M., & Villa, F. Nano-machining, surface analysis and emittance measurements of a copper photocathode at SPARC_LAB. United States. doi:10.1016/j.nima.2018.01.041.
Scifo, J., Alesini, D., Anania, M. P., Bellaveglia, M., Bellucci, S., Biagioni, A., Bisesto, F., Cardelli, F., Chiadroni, E., Cianchi, A., Costa, G., Di Giovenale, D., Di Pirro, G., Di Raddo, R., Dowell, D. H., Ferrario, M., Giribono, A., Lorusso, A., Micciulla, F., Mostacci, A., Passeri, D., Perrone, A., Piersanti, L., Pompili, R., Shpakov, V., Stella, A., Trovò, M., and Villa, F. Wed . "Nano-machining, surface analysis and emittance measurements of a copper photocathode at SPARC_LAB". United States. doi:10.1016/j.nima.2018.01.041. https://www.osti.gov/servlets/purl/1490679.
@article{osti_1490679,
title = {Nano-machining, surface analysis and emittance measurements of a copper photocathode at SPARC_LAB},
author = {Scifo, J. and Alesini, D. and Anania, M. P. and Bellaveglia, M. and Bellucci, S. and Biagioni, A. and Bisesto, F. and Cardelli, F. and Chiadroni, E. and Cianchi, A. and Costa, G. and Di Giovenale, D. and Di Pirro, G. and Di Raddo, R. and Dowell, D. H. and Ferrario, M. and Giribono, A. and Lorusso, A. and Micciulla, F. and Mostacci, A. and Passeri, D. and Perrone, A. and Piersanti, L. and Pompili, R. and Shpakov, V. and Stella, A. and Trovò, M. and Villa, F.},
abstractNote = {R&D activity on Cu photocathodes is under development at the SPARC_LAB test facility to fully characterize each stage of the photocathode “life” and to have a complete overview of the photoemission properties in high brightness photo-injectors. The nano(n)-machining process presented here consists in diamond milling, and blowing with dry nitrogen. This procedure reduces the roughness of the cathode surface and prevents surface contamination introduced by other techniques, such as polishing with diamond paste or the machining with oil. Both high roughness and surface contamination cause an increase of intrinsic emittance and consequently a reduction of the overall electron beam brightness. To quantify these effects, we have characterized the photocathode surface in terms of roughness measurement, and morphology and chemical composition analysis by means of Scanning Electron Microscopy (SEM), Energy Dispersive Spectroscopy (EDS), and Atomic Force Microscopy (AFM) techniques. The effects of n-machining on the electron beam quality have been also investigated through emittance measurements before and after the surface processing technique. Finally, we present preliminary emittance studies of yttrium thin film on Cu photocathodes.},
doi = {10.1016/j.nima.2018.01.041},
journal = {Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment},
number = C,
volume = 909,
place = {United States},
year = {2018},
month = {1}
}

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