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Title: Analysis of Potential-Induced Degradation in Soda-Lime Glass and Borosilicate-Glass Cu(In,Ga)Se 2 Samples

Abstract

In this study, potential-induced degradation (PID) is investigated in small-size Cu(In,Ga)Se 2 (CIGS) submodules of individual cells. Samples with conventional soda-lime glass (SLG) and low-alkaline glass (borosilicate glass, BSG) were analyzed applying positive and negative 1000 V bias at 85 degrees C and low relative humidity after a heat-soaking phase. During the heat-soaking phase, BSG samples showed degradation, with variations in their dark current-voltage (I-V) curve parameters compared with the stability of SLG samples. During the PID stress phase, back-grounded SLG samples with -1000 V applied to the cell experienced fast degradation, with complete failure in 25 h, whereas, BSG samples only showed changes because of the dark heat environment. When grounded on their front face, SLG samples remained stable during more than 150 h of PID testing, beginning degradation after longer applications of stress. The analysis of the dark I-V curves of SLG samples through the single-diode model showed that an increase in saturation current J 0 occurs first, attributed to Na + ions migrating into the CdS/ZnO layer; later, a decrease in shunt resistance occurs. Lastly, the application of the model in BSG samples showed an increase in series resistance evaluated at 25 degrees C. When the biasmore » is reversed, SLG samples gradually recover their performance.« less

Authors:
 [1];  [2];  [2];  [2];  [2]
  1. Centro de Investigaciones Energéticas, Medioambientales y Tecnológicas, Madrid (Spain)
  2. National Renewable Energy Lab. (NREL), Golden, CO (United States)
Publication Date:
Research Org.:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
OSTI Identifier:
1489186
Report Number(s):
NREL/JA-5K00-72802
Journal ID: ISSN 2156-3381
Grant/Contract Number:  
AC36-08GO28308
Resource Type:
Accepted Manuscript
Journal Name:
IEEE Journal of Photovoltaics
Additional Journal Information:
Journal Volume: 9; Journal Issue: 1; Journal ID: ISSN 2156-3381
Publisher:
IEEE
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; 36 MATERIALS SCIENCE; degradation; glass; stress; mathematical model; heating systems; renewable energy sources; current measurement

Citation Formats

Alonso-Garcia, M. Carmen, Hacke, Peter, Glynn, Stephen, Muzzillo, Christopher P., and Mansfield, Lorelle M. Analysis of Potential-Induced Degradation in Soda-Lime Glass and Borosilicate-Glass Cu(In,Ga)Se2 Samples. United States: N. p., 2018. Web. doi:10.1109/JPHOTOV.2018.2882195.
Alonso-Garcia, M. Carmen, Hacke, Peter, Glynn, Stephen, Muzzillo, Christopher P., & Mansfield, Lorelle M. Analysis of Potential-Induced Degradation in Soda-Lime Glass and Borosilicate-Glass Cu(In,Ga)Se2 Samples. United States. doi:10.1109/JPHOTOV.2018.2882195.
Alonso-Garcia, M. Carmen, Hacke, Peter, Glynn, Stephen, Muzzillo, Christopher P., and Mansfield, Lorelle M. Wed . "Analysis of Potential-Induced Degradation in Soda-Lime Glass and Borosilicate-Glass Cu(In,Ga)Se2 Samples". United States. doi:10.1109/JPHOTOV.2018.2882195. https://www.osti.gov/servlets/purl/1489186.
@article{osti_1489186,
title = {Analysis of Potential-Induced Degradation in Soda-Lime Glass and Borosilicate-Glass Cu(In,Ga)Se2 Samples},
author = {Alonso-Garcia, M. Carmen and Hacke, Peter and Glynn, Stephen and Muzzillo, Christopher P. and Mansfield, Lorelle M.},
abstractNote = {In this study, potential-induced degradation (PID) is investigated in small-size Cu(In,Ga)Se2 (CIGS) submodules of individual cells. Samples with conventional soda-lime glass (SLG) and low-alkaline glass (borosilicate glass, BSG) were analyzed applying positive and negative 1000 V bias at 85 degrees C and low relative humidity after a heat-soaking phase. During the heat-soaking phase, BSG samples showed degradation, with variations in their dark current-voltage (I-V) curve parameters compared with the stability of SLG samples. During the PID stress phase, back-grounded SLG samples with -1000 V applied to the cell experienced fast degradation, with complete failure in 25 h, whereas, BSG samples only showed changes because of the dark heat environment. When grounded on their front face, SLG samples remained stable during more than 150 h of PID testing, beginning degradation after longer applications of stress. The analysis of the dark I-V curves of SLG samples through the single-diode model showed that an increase in saturation current J0 occurs first, attributed to Na+ ions migrating into the CdS/ZnO layer; later, a decrease in shunt resistance occurs. Lastly, the application of the model in BSG samples showed an increase in series resistance evaluated at 25 degrees C. When the bias is reversed, SLG samples gradually recover their performance.},
doi = {10.1109/JPHOTOV.2018.2882195},
journal = {IEEE Journal of Photovoltaics},
number = 1,
volume = 9,
place = {United States},
year = {2018},
month = {12}
}

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