skip to main content
DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Microscopy Instrumentation and Nanopositioning at NSLS-II: Current Status and Future Directions

Abstract

The development of ultra-brilliant synchrotron facilities and recent advances in the fabrication of efficient nano-focusing optics have stimulated rapid development and applications of the focused beams used to elucidate nanoscale phenomena in many areas of science and technology. Various nano-focusing optics, including Kirkpatrick- Baez (KB) and elliptical mirrors, Fresnel zone plates (ZP), compound refractive and kinoform lenses, and multilayer Laue lenses (MLL), are routinely used to achieve nano-focusing. The latest experiments utilizing KB mirrors have demonstrated focal spot size of 13 nm with the ZPs and MLLs being able to focus hard X-rays to 10 nm and below. When the focused beam size is reduced to below 100 nm, there is a need to develop a dedicated system tailored for a specific application, which satisfies stringent mechanical, vibrational, and thermal characteristics to successfully enable nano-scale imaging. Multiple degrees of motion, including their positioning accuracy, resonance frequencies, and amount of heat being dissipated, have to be thoroughly considered in order to efficiently perform nano-focusing experiments.

Authors:
ORCiD logo [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1483564
Report Number(s):
BNL-209504-2018-JAAM
Journal ID: ISSN 0894-0886
Grant/Contract Number:  
SC0012704
Resource Type:
Accepted Manuscript
Journal Name:
Synchrotron Radiation News
Additional Journal Information:
Journal Volume: 31; Journal Issue: 5; Journal ID: ISSN 0894-0886
Publisher:
Taylor & Francis
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Nazaretski, E., Xu, W., Yan, H., Huang, X., Coburn, D. S., Ge, M., Lee, W. -K., Gao, Y., Xu, W., Fuchs, M. R., and Chu, Y. S. Microscopy Instrumentation and Nanopositioning at NSLS-II: Current Status and Future Directions. United States: N. p., 2018. Web. doi:10.1080/08940886.2018.1506233.
Nazaretski, E., Xu, W., Yan, H., Huang, X., Coburn, D. S., Ge, M., Lee, W. -K., Gao, Y., Xu, W., Fuchs, M. R., & Chu, Y. S. Microscopy Instrumentation and Nanopositioning at NSLS-II: Current Status and Future Directions. United States. doi:10.1080/08940886.2018.1506233.
Nazaretski, E., Xu, W., Yan, H., Huang, X., Coburn, D. S., Ge, M., Lee, W. -K., Gao, Y., Xu, W., Fuchs, M. R., and Chu, Y. S. Tue . "Microscopy Instrumentation and Nanopositioning at NSLS-II: Current Status and Future Directions". United States. doi:10.1080/08940886.2018.1506233. https://www.osti.gov/servlets/purl/1483564.
@article{osti_1483564,
title = {Microscopy Instrumentation and Nanopositioning at NSLS-II: Current Status and Future Directions},
author = {Nazaretski, E. and Xu, W. and Yan, H. and Huang, X. and Coburn, D. S. and Ge, M. and Lee, W. -K. and Gao, Y. and Xu, W. and Fuchs, M. R. and Chu, Y. S.},
abstractNote = {The development of ultra-brilliant synchrotron facilities and recent advances in the fabrication of efficient nano-focusing optics have stimulated rapid development and applications of the focused beams used to elucidate nanoscale phenomena in many areas of science and technology. Various nano-focusing optics, including Kirkpatrick- Baez (KB) and elliptical mirrors, Fresnel zone plates (ZP), compound refractive and kinoform lenses, and multilayer Laue lenses (MLL), are routinely used to achieve nano-focusing. The latest experiments utilizing KB mirrors have demonstrated focal spot size of 13 nm with the ZPs and MLLs being able to focus hard X-rays to 10 nm and below. When the focused beam size is reduced to below 100 nm, there is a need to develop a dedicated system tailored for a specific application, which satisfies stringent mechanical, vibrational, and thermal characteristics to successfully enable nano-scale imaging. Multiple degrees of motion, including their positioning accuracy, resonance frequencies, and amount of heat being dissipated, have to be thoroughly considered in order to efficiently perform nano-focusing experiments.},
doi = {10.1080/08940886.2018.1506233},
journal = {Synchrotron Radiation News},
number = 5,
volume = 31,
place = {United States},
year = {2018},
month = {9}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

Figures / Tables:

Figure 1 Figure 1: Two types of nano-focusing optics implemented in the HXN microscope: (a) MLLs; (b) ZP optics. For MLLs, two linear optics have to be aligned orthogonally with respect to each other to achieve point focusing. The degrees of motion required to perform optics alignment and manipulation are shown.

Save / Share:

Works referenced in this record:

Hard x-ray scanning imaging achieved with bonded multilayer Laue lenses
journal, January 2017

  • Huang, Xiaojing; Xu, Weihe; Nazaretski, Evgeny
  • Optics Express, Vol. 25, Issue 8
  • DOI: 10.1364/OE.25.008698

Interlaced zone plate optics for hard X-ray imaging in the 10 nm range
journal, March 2017

  • Mohacsi, Istvan; Vartiainen, Ismo; Rösner, Benedikt
  • Scientific Reports, Vol. 7, Issue 1
  • DOI: 10.1038/srep43624

Micro-crystallography comes of age
journal, October 2012

  • Smith, Janet L.; Fischetti, Robert F.; Yamamoto, Masaki
  • Current Opinion in Structural Biology, Vol. 22, Issue 5
  • DOI: 10.1016/j.sbi.2012.09.001

Serial crystallography on in vivo grown microcrystals using synchrotron radiation
journal, February 2014


Multilayer Laue Lens: A Brief History and Current Status
journal, July 2016


Multimodal hard x-ray imaging with resolution approaching 10 nm for studies in material science
journal, March 2018


Automated markerless full field hard x-ray microscopic tomography at sub-50 nm 3-dimension spatial resolution
journal, April 2012

  • Wang, Jun; Karen Chen, Yu-chen; Yuan, Qingxi
  • Applied Physics Letters, Vol. 100, Issue 14
  • DOI: 10.1063/1.3701579

Quantum enhancement of accuracy and precision in optical interferometry
journal, November 2017

  • Kaiser, Florian; Vergyris, Panagiotis; Aktas, Djeylan
  • Light: Science & Applications, Vol. 7, Issue 3
  • DOI: 10.1038/lsa.2017.163

Sample manipulation and data assembly for robust microcrystal synchrotron crystallography
journal, April 2018


Performance and characterization of the prototype nm-scale spatial resolution scanning multilayer Laue lenses microscope
journal, March 2013

  • Nazaretski, E.; Kim, Jungdae; Yan, H.
  • Review of Scientific Instruments, Vol. 84, Issue 3
  • DOI: 10.1063/1.4774387

Design and characterization of a compact nano-positioning system for a portable transmission x-ray microscope
journal, December 2013

  • Hwu, En-Te; Nazaretski, Evgeny; Chu, Yong S.
  • Review of Scientific Instruments, Vol. 84, Issue 12
  • DOI: 10.1063/1.4838635

Raster-scanning serial protein crystallography using micro- and nano-focused synchrotron beams
journal, April 2015

  • Coquelle, Nicolas; Brewster, Aaron S.; Kapp, Ulrike
  • Acta Crystallographica Section D Biological Crystallography, Vol. 71, Issue 5
  • DOI: 10.1107/S1399004715004514

Oxidation of PtNi nanoparticles studied by a scanning X-ray fluorescence microscope with multi-layer Laue lenses
journal, January 2013

  • Kang, Hyon Chol; Yan, Hanfei; Chu, Yong S.
  • Nanoscale, Vol. 5, Issue 16
  • DOI: 10.1039/c3nr00396e

Design and performance of a scanning ptychography microscope
journal, March 2014

  • Nazaretski, E.; Huang, X.; Yan, H.
  • Review of Scientific Instruments, Vol. 85, Issue 3
  • DOI: 10.1063/1.4868968

Multimodality hard-x-ray imaging of a chromosome with nanoscale spatial resolution
journal, February 2016

  • Yan, Hanfei; Nazaretski, Evgeny; Lauer, Kenneth
  • Scientific Reports, Vol. 6, Issue 1
  • DOI: 10.1038/srep20112

NSLS-II biomedical beamlines for micro-crystallography, FMX, and for highly automated crystallography, AMX: New opportunities for advanced data collection
conference, January 2016

  • Fuchs, Martin R.; Bhogadi, Dileep K.; Jakoncic, Jean
  • PROCEEDINGS OF THE 12TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION – SRI2015, AIP Conference Proceedings
  • DOI: 10.1063/1.4952829

Pushing the limits: an instrument for hard X-ray imaging below 20 nm
journal, January 2015


High resolution tip-tilt positioning system for a next generation MLL-based x-ray microscope
journal, November 2017

  • Xu, Weihe; Schlossberger, Noah; Xu, Wei
  • Measurement Science and Technology, Vol. 28, Issue 12
  • DOI: 10.1088/1361-6501/aa8916

Optomechanical Design of a Multilayer Laue Lens Test Bed for 10-nm Focusing of Hard X-rays
journal, October 2013


Design and performance of an X-ray scanning microscope at the Hard X-ray Nanoprobe beamline of NSLS-II
journal, October 2017


Protein microcrystallography using synchrotron radiation
journal, August 2017


Development and characterization of monolithic multilayer Laue lens nanofocusing optics
journal, June 2016

  • Nazaretski, E.; Xu, W.; Bouet, N.
  • Applied Physics Letters, Vol. 108, Issue 26
  • DOI: 10.1063/1.4955022

Sources of inspiration
journal, January 2014

  • McSweeney, Sean; Fromme, Petra
  • Nature, Vol. 505, Issue 7485
  • DOI: 10.1038/505620a

Efficient concentration of high-energy x-rays for diffraction-limited imaging resolution
journal, January 2017


High-resolution non-destructive three-dimensional imaging of integrated circuits
journal, March 2017

  • Holler, Mirko; Guizar-Sicairos, Manuel; Tsai, Esther H. R.
  • Nature, Vol. 543, Issue 7645
  • DOI: 10.1038/nature21698

Achieving diffraction-limited nanometer-scale X-ray point focus with two crossed multilayer Laue lenses: alignment challenges
journal, January 2017

  • Yan, Hanfei; Huang, Xiaojing; Bouet, Nathalie
  • Optics Express, Vol. 25, Issue 21
  • DOI: 10.1364/OE.25.025234

Compact prototype apparatus for reducing the circle of confusion down to 40 nm for x-ray nanotomography
journal, March 2013

  • Kim, Jungdae; Lauer, K.; Yan, H.
  • Review of Scientific Instruments, Vol. 84, Issue 3
  • DOI: 10.1063/1.4798546

    Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.