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Title: Microscopy Instrumentation and Nanopositioning at NSLS-II: Current Status and Future Directions

Abstract

The development of ultra-brilliant synchrotron facilities and recent advances in the fabrication of efficient nano-focusing optics have stimulated rapid development and applications of the focused beams used to elucidate nanoscale phenomena in many areas of science and technology. Various nano-focusing optics, including Kirkpatrick- Baez (KB) and elliptical mirrors, Fresnel zone plates (ZP), compound refractive and kinoform lenses, and multilayer Laue lenses (MLL), are routinely used to achieve nano-focusing. The latest experiments utilizing KB mirrors have demonstrated focal spot size of 13 nm with the ZPs and MLLs being able to focus hard X-rays to 10 nm and below. When the focused beam size is reduced to below 100 nm, there is a need to develop a dedicated system tailored for a specific application, which satisfies stringent mechanical, vibrational, and thermal characteristics to successfully enable nano-scale imaging. Multiple degrees of motion, including their positioning accuracy, resonance frequencies, and amount of heat being dissipated, have to be thoroughly considered in order to efficiently perform nano-focusing experiments.

Authors:
ORCiD logo [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1483564
Report Number(s):
BNL-209504-2018-JAAM
Journal ID: ISSN 0894-0886
Grant/Contract Number:  
SC0012704
Resource Type:
Accepted Manuscript
Journal Name:
Synchrotron Radiation News
Additional Journal Information:
Journal Volume: 31; Journal Issue: 5; Journal ID: ISSN 0894-0886
Publisher:
Taylor & Francis
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Nazaretski, E., Xu, W., Yan, H., Huang, X., Coburn, D. S., Ge, M., Lee, W. -K., Gao, Y., Xu, W., Fuchs, M. R., and Chu, Y. S. Microscopy Instrumentation and Nanopositioning at NSLS-II: Current Status and Future Directions. United States: N. p., 2018. Web. doi:10.1080/08940886.2018.1506233.
Nazaretski, E., Xu, W., Yan, H., Huang, X., Coburn, D. S., Ge, M., Lee, W. -K., Gao, Y., Xu, W., Fuchs, M. R., & Chu, Y. S. Microscopy Instrumentation and Nanopositioning at NSLS-II: Current Status and Future Directions. United States. doi:10.1080/08940886.2018.1506233.
Nazaretski, E., Xu, W., Yan, H., Huang, X., Coburn, D. S., Ge, M., Lee, W. -K., Gao, Y., Xu, W., Fuchs, M. R., and Chu, Y. S. Tue . "Microscopy Instrumentation and Nanopositioning at NSLS-II: Current Status and Future Directions". United States. doi:10.1080/08940886.2018.1506233. https://www.osti.gov/servlets/purl/1483564.
@article{osti_1483564,
title = {Microscopy Instrumentation and Nanopositioning at NSLS-II: Current Status and Future Directions},
author = {Nazaretski, E. and Xu, W. and Yan, H. and Huang, X. and Coburn, D. S. and Ge, M. and Lee, W. -K. and Gao, Y. and Xu, W. and Fuchs, M. R. and Chu, Y. S.},
abstractNote = {The development of ultra-brilliant synchrotron facilities and recent advances in the fabrication of efficient nano-focusing optics have stimulated rapid development and applications of the focused beams used to elucidate nanoscale phenomena in many areas of science and technology. Various nano-focusing optics, including Kirkpatrick- Baez (KB) and elliptical mirrors, Fresnel zone plates (ZP), compound refractive and kinoform lenses, and multilayer Laue lenses (MLL), are routinely used to achieve nano-focusing. The latest experiments utilizing KB mirrors have demonstrated focal spot size of 13 nm with the ZPs and MLLs being able to focus hard X-rays to 10 nm and below. When the focused beam size is reduced to below 100 nm, there is a need to develop a dedicated system tailored for a specific application, which satisfies stringent mechanical, vibrational, and thermal characteristics to successfully enable nano-scale imaging. Multiple degrees of motion, including their positioning accuracy, resonance frequencies, and amount of heat being dissipated, have to be thoroughly considered in order to efficiently perform nano-focusing experiments.},
doi = {10.1080/08940886.2018.1506233},
journal = {Synchrotron Radiation News},
number = 5,
volume = 31,
place = {United States},
year = {2018},
month = {9}
}

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