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Title: Microscopy Instrumentation and Nanopositioning at NSLS-II: Current Status and Future Directions

Abstract

The development of ultra-brilliant synchrotron facilities and recent advances in the fabrication of efficient nano-focusing optics have stimulated rapid development and applications of the focused beams used to elucidate nanoscale phenomena in many areas of science and technology. Various nano-focusing optics, including Kirkpatrick- Baez (KB) and elliptical mirrors, Fresnel zone plates (ZP), compound refractive and kinoform lenses, and multilayer Laue lenses (MLL), are routinely used to achieve nano-focusing. The latest experiments utilizing KB mirrors have demonstrated focal spot size of 13 nm with the ZPs and MLLs being able to focus hard X-rays to 10 nm and below. When the focused beam size is reduced to below 100 nm, there is a need to develop a dedicated system tailored for a specific application, which satisfies stringent mechanical, vibrational, and thermal characteristics to successfully enable nano-scale imaging. Multiple degrees of motion, including their positioning accuracy, resonance frequencies, and amount of heat being dissipated, have to be thoroughly considered in order to efficiently perform nano-focusing experiments.

Authors:
ORCiD logo [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1]
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  1. Brookhaven National Lab. (BNL), Upton, NY (United States)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1483564
Report Number(s):
BNL-209504-2018-JAAM
Journal ID: ISSN 0894-0886
Grant/Contract Number:  
SC0012704
Resource Type:
Accepted Manuscript
Journal Name:
Synchrotron Radiation News
Additional Journal Information:
Journal Volume: 31; Journal Issue: 5; Journal ID: ISSN 0894-0886
Publisher:
Taylor & Francis
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Nazaretski, E., Xu, W., Yan, H., Huang, X., Coburn, D. S., Ge, M., Lee, W. -K., Gao, Y., Xu, W., Fuchs, M. R., and Chu, Y. S. Microscopy Instrumentation and Nanopositioning at NSLS-II: Current Status and Future Directions. United States: N. p., 2018. Web. doi:10.1080/08940886.2018.1506233.
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Nazaretski, E., Xu, W., Yan, H., Huang, X., Coburn, D. S., Ge, M., Lee, W. -K., Gao, Y., Xu, W., Fuchs, M. R., & Chu, Y. S. Microscopy Instrumentation and Nanopositioning at NSLS-II: Current Status and Future Directions. United States. https://doi.org/10.1080/08940886.2018.1506233
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Nazaretski, E., Xu, W., Yan, H., Huang, X., Coburn, D. S., Ge, M., Lee, W. -K., Gao, Y., Xu, W., Fuchs, M. R., and Chu, Y. S. Tue . "Microscopy Instrumentation and Nanopositioning at NSLS-II: Current Status and Future Directions". United States. https://doi.org/10.1080/08940886.2018.1506233. https://www.osti.gov/servlets/purl/1483564.
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@article{osti_1483564,
title = {Microscopy Instrumentation and Nanopositioning at NSLS-II: Current Status and Future Directions},
author = {Nazaretski, E. and Xu, W. and Yan, H. and Huang, X. and Coburn, D. S. and Ge, M. and Lee, W. -K. and Gao, Y. and Xu, W. and Fuchs, M. R. and Chu, Y. S.},
abstractNote = {The development of ultra-brilliant synchrotron facilities and recent advances in the fabrication of efficient nano-focusing optics have stimulated rapid development and applications of the focused beams used to elucidate nanoscale phenomena in many areas of science and technology. Various nano-focusing optics, including Kirkpatrick- Baez (KB) and elliptical mirrors, Fresnel zone plates (ZP), compound refractive and kinoform lenses, and multilayer Laue lenses (MLL), are routinely used to achieve nano-focusing. The latest experiments utilizing KB mirrors have demonstrated focal spot size of 13 nm with the ZPs and MLLs being able to focus hard X-rays to 10 nm and below. When the focused beam size is reduced to below 100 nm, there is a need to develop a dedicated system tailored for a specific application, which satisfies stringent mechanical, vibrational, and thermal characteristics to successfully enable nano-scale imaging. Multiple degrees of motion, including their positioning accuracy, resonance frequencies, and amount of heat being dissipated, have to be thoroughly considered in order to efficiently perform nano-focusing experiments.},
doi = {10.1080/08940886.2018.1506233},
journal = {Synchrotron Radiation News},
number = 5,
volume = 31,
place = {United States},
year = {Tue Sep 25 00:00:00 EDT 2018},
month = {Tue Sep 25 00:00:00 EDT 2018}
}
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Journal Article:
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Publisher's Version of Record
https://doi.org/10.1080/08940886.2018.1506233
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Figures / Tables:

Figure 1 Figure 1: Two types of nano-focusing optics implemented in the HXN microscope: (a) MLLs; (b) ZP optics. For MLLs, two linear optics have to be aligned orthogonally with respect to each other to achieve point focusing. The degrees of motion required to perform optics alignment and manipulation are shown.
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