Microscopy Instrumentation and Nanopositioning at NSLS-II: Current Status and Future Directions
- Brookhaven National Lab. (BNL), Upton, NY (United States)
The development of ultra-brilliant synchrotron facilities and recent advances in the fabrication of efficient nano-focusing optics have stimulated rapid development and applications of the focused beams used to elucidate nanoscale phenomena in many areas of science and technology. Various nano-focusing optics, including Kirkpatrick- Baez (KB) and elliptical mirrors, Fresnel zone plates (ZP), compound refractive and kinoform lenses, and multilayer Laue lenses (MLL), are routinely used to achieve nano-focusing. The latest experiments utilizing KB mirrors have demonstrated focal spot size of 13 nm with the ZPs and MLLs being able to focus hard X-rays to 10 nm and below. When the focused beam size is reduced to below 100 nm, there is a need to develop a dedicated system tailored for a specific application, which satisfies stringent mechanical, vibrational, and thermal characteristics to successfully enable nano-scale imaging. Multiple degrees of motion, including their positioning accuracy, resonance frequencies, and amount of heat being dissipated, have to be thoroughly considered in order to efficiently perform nano-focusing experiments.
- Research Organization:
- Brookhaven National Laboratory (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- Grant/Contract Number:
- SC0012704
- OSTI ID:
- 1483564
- Report Number(s):
- BNL-209504-2018-JAAM
- Journal Information:
- Synchrotron Radiation News, Vol. 31, Issue 5; ISSN 0894-0886
- Publisher:
- Taylor & FrancisCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Similar Records
Development of X-ray Microscopy at IPOE
A combined Kirkpatrick-Baez mirror and multilayer lens for sub-10 nm x-ray focusing