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Title: Detwinning through migration of twin boundaries in nanotwinned Cu films under in situ ion irradiation

Abstract

The mechanism of radiation-induced detwinning is different from that of deformation detwinning as the former is dominated by supersaturated radiation-induced defects while the latter is usually triggered by global stress. In situ Kr ion irradiation was performed to study the detwinning mechanism of nanotwinned Cu films with various twin thicknesses. Two types of incoherent twin boundaries (ITBs), so-called fixed ITBs and free ITBs, are characterized based on their structural features, and the difference in their migration behavior is investigated. It is observed that detwinning during radiation is attributed to the frequent migration of free ITBs, while the migration of fixed ITBs is absent. Statistics shows that the migration distance of free ITBs is thickness and dose dependent. Here, potential migration mechanisms are discussed.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [2];  [3];  [4];  [4]
  1. Peking Univ., Beijing (People's Republic of China)
  2. China Univ. of Petroleum, Beijing (People's Republic of China)
  3. Xi’an Jiaotong Univ. Xi’an (People's Republic of China)
  4. Argonne National Lab. (ANL), Argonne, IL (United States)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
Ministry of Science and Technology of the People's Republic of China; National Natural Science Foundation of China (NSFC); China University of Petroleum; USDOE
OSTI Identifier:
1483413
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
Science and Technology of Advanced Materials
Additional Journal Information:
Journal Volume: 19; Journal Issue: 1; Journal ID: ISSN 1468-6996
Publisher:
IOP Publishing
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; detwinning; in situ; ion irradiation; nanotwins

Citation Formats

Du, Jinlong, Wu, Zaoming, Fu, Engang, Liang, Yanxiang, Wang, Xingjun, Wang, Peipei, Yu, Kaiyuan, Ding, Xiangdong, Li, Meimei, and Kirk, Marquis A. Detwinning through migration of twin boundaries in nanotwinned Cu films under in situ ion irradiation. United States: N. p., 2018. Web. doi:10.1080/14686996.2018.1428877.
Du, Jinlong, Wu, Zaoming, Fu, Engang, Liang, Yanxiang, Wang, Xingjun, Wang, Peipei, Yu, Kaiyuan, Ding, Xiangdong, Li, Meimei, & Kirk, Marquis A. Detwinning through migration of twin boundaries in nanotwinned Cu films under in situ ion irradiation. United States. https://doi.org/10.1080/14686996.2018.1428877
Du, Jinlong, Wu, Zaoming, Fu, Engang, Liang, Yanxiang, Wang, Xingjun, Wang, Peipei, Yu, Kaiyuan, Ding, Xiangdong, Li, Meimei, and Kirk, Marquis A. Fri . "Detwinning through migration of twin boundaries in nanotwinned Cu films under in situ ion irradiation". United States. https://doi.org/10.1080/14686996.2018.1428877. https://www.osti.gov/servlets/purl/1483413.
@article{osti_1483413,
title = {Detwinning through migration of twin boundaries in nanotwinned Cu films under in situ ion irradiation},
author = {Du, Jinlong and Wu, Zaoming and Fu, Engang and Liang, Yanxiang and Wang, Xingjun and Wang, Peipei and Yu, Kaiyuan and Ding, Xiangdong and Li, Meimei and Kirk, Marquis A.},
abstractNote = {The mechanism of radiation-induced detwinning is different from that of deformation detwinning as the former is dominated by supersaturated radiation-induced defects while the latter is usually triggered by global stress. In situ Kr ion irradiation was performed to study the detwinning mechanism of nanotwinned Cu films with various twin thicknesses. Two types of incoherent twin boundaries (ITBs), so-called fixed ITBs and free ITBs, are characterized based on their structural features, and the difference in their migration behavior is investigated. It is observed that detwinning during radiation is attributed to the frequent migration of free ITBs, while the migration of fixed ITBs is absent. Statistics shows that the migration distance of free ITBs is thickness and dose dependent. Here, potential migration mechanisms are discussed.},
doi = {10.1080/14686996.2018.1428877},
journal = {Science and Technology of Advanced Materials},
number = 1,
volume = 19,
place = {United States},
year = {Fri Mar 02 00:00:00 EST 2018},
month = {Fri Mar 02 00:00:00 EST 2018}
}

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Free Publicly Available Full Text
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Figures / Tables:

Figure 1 Figure 1:  (a) Bright-field (Bf) XTeM micrograph with [011̄] zone axis and (b) the statistic graph of twin thickness of the as-deposited nT cu film.

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Works referencing / citing this record:

Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.