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Title: Soft x-ray optical constants of sputtered chromium thin films with improved accuracy in the L and M absorption edge regions

Authors:
 [1];  [2];  [2];  [3];  [4];  [5];  [5]; ORCiD logo [6];  [6];  [2]
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  1. Universite Paris-Saclay (France). Laboratoire Charles Fabry, Institut d'Optique Graduate School, CNRS; Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Center for X-ray Optics
  2. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Center for X-ray Optics
  3. Universite Paris-Saclay (France). Laboratoire Charles Fabry, Institut d'Optique Graduate School, CNRS; Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  4. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  5. Universite Paris-Saclay (France). Laboratoire Charles Fabry, Institut d'Optique Graduate School, CNRS
  6. Institut des NanoSciences de Paris (France)
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC); USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1482536
Alternate Identifier(s):
OSTI ID: 1527275
Report Number(s):
LLNL-JRNL-768637
Journal ID: ISSN 0021-8979; ark:/13030/qt0b28x4nt
Grant/Contract Number:  
AC02-05CH11231; AC52-07NA27344
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 124; Journal Issue: 3; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS

Citation Formats

Delmotte, Franck, Meyer-Ilse, Julia, Salmassi, Farhad, Soufli, Regina, Burcklen, Catherine, Rebellato, Jennifer, Jérome, Arnaud, Vickridge, Ian, Briand, Emrick, and Gullikson, Eric. Soft x-ray optical constants of sputtered chromium thin films with improved accuracy in the L and M absorption edge regions. United States: N. p., 2018. Web. doi:10.1063/1.5027488.
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Delmotte, Franck, Meyer-Ilse, Julia, Salmassi, Farhad, Soufli, Regina, Burcklen, Catherine, Rebellato, Jennifer, Jérome, Arnaud, Vickridge, Ian, Briand, Emrick, & Gullikson, Eric. Soft x-ray optical constants of sputtered chromium thin films with improved accuracy in the L and M absorption edge regions. United States. https://doi.org/10.1063/1.5027488
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Delmotte, Franck, Meyer-Ilse, Julia, Salmassi, Farhad, Soufli, Regina, Burcklen, Catherine, Rebellato, Jennifer, Jérome, Arnaud, Vickridge, Ian, Briand, Emrick, and Gullikson, Eric. Thu . "Soft x-ray optical constants of sputtered chromium thin films with improved accuracy in the L and M absorption edge regions". United States. https://doi.org/10.1063/1.5027488. https://www.osti.gov/servlets/purl/1482536.
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@article{osti_1482536,
title = {Soft x-ray optical constants of sputtered chromium thin films with improved accuracy in the L and M absorption edge regions},
author = {Delmotte, Franck and Meyer-Ilse, Julia and Salmassi, Farhad and Soufli, Regina and Burcklen, Catherine and Rebellato, Jennifer and Jérome, Arnaud and Vickridge, Ian and Briand, Emrick and Gullikson, Eric},
abstractNote = {},
doi = {10.1063/1.5027488},
journal = {Journal of Applied Physics},
number = 3,
volume = 124,
place = {United States},
year = {2018},
month = {7}
}
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https://doi.org/10.1063/1.5027488
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    Works referencing / citing this record:

    Optical constants of magnetron sputtered Pt thin films with improved accuracy in the N- and O-electronic shell absorption regions
    journal, February 2019

    • Soufli, Regina; Delmotte, Franck; Meyer-Ilse, Julia
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    • DOI: 10.1063/1.5067366

    Optical constants of sputtered beryllium thin films determined from photoabsorption measurements in the spectral range 20.4–250 eV
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    • Svechnikov, Mikhail; Chkhalo, Nikolay; Lopatin, Alexey
    • Journal of Synchrotron Radiation, Vol. 27, Issue 1
    • DOI: 10.1107/s1600577519014188
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