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Title: Soft X-ray backlighter source driven by a short-pulse laser for pump-probe characterization of warm dense matter

Abstract

In this paper, we propose a pump-probe X-ray absorption spectroscopy temperature measurement technique appropriate for matter having temperature in the range of 10 to a few 100 eV and density up to solid density. Atomic modeling simulations indicate that for various low- to mid-Z materials in this range the energy and optical depth of bound-bound and bound-free absorption features are sensitive to temperature. We discuss sample thickness and tamp layer considerations. A series of experimental investigations was carried out using a range of laser parameters with pulse duration ≤5 ps and various pure and alloyed materials to identify backlighter sources suitable for the technique.

Authors:
ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [2]; ORCiD logo [3];  [3]; ORCiD logo [4];  [5]; ORCiD logo [3]; ORCiD logo [3];  [3]; ORCiD logo [3];  [5];  [1]
  1. Univ. of California, San Diego, La Jolla, CA (United States)
  2. Univ. of Oxford, Oxford (United Kingdom)
  3. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  4. GSI Helmholtzzentrum, Darmstadt (Germany)
  5. General Atomics, San Diego, CA (United States)
Publication Date:
Research Org.:
Univ. of California, San Diego, La Jolla, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Fusion Energy Sciences (FES) (SC-24)
OSTI Identifier:
1482222
Alternate Identifier(s):
OSTI ID: 1477811
Grant/Contract Number:  
SC0014600
Resource Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 89; Journal Issue: 10; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

McGuffey, C., Dozières, M., Kim, J., Savin, A., Park, J., Emig, J., Brabetz, C., Carlson, L., Heeter, R. F., McLean, H. S., Moody, J., Schneider, M. B., Wei, M. S., and Beg, F. N. Soft X-ray backlighter source driven by a short-pulse laser for pump-probe characterization of warm dense matter. United States: N. p., 2018. Web. doi:10.1063/1.5039419.
McGuffey, C., Dozières, M., Kim, J., Savin, A., Park, J., Emig, J., Brabetz, C., Carlson, L., Heeter, R. F., McLean, H. S., Moody, J., Schneider, M. B., Wei, M. S., & Beg, F. N. Soft X-ray backlighter source driven by a short-pulse laser for pump-probe characterization of warm dense matter. United States. doi:10.1063/1.5039419.
McGuffey, C., Dozières, M., Kim, J., Savin, A., Park, J., Emig, J., Brabetz, C., Carlson, L., Heeter, R. F., McLean, H. S., Moody, J., Schneider, M. B., Wei, M. S., and Beg, F. N. Tue . "Soft X-ray backlighter source driven by a short-pulse laser for pump-probe characterization of warm dense matter". United States. doi:10.1063/1.5039419. https://www.osti.gov/servlets/purl/1482222.
@article{osti_1482222,
title = {Soft X-ray backlighter source driven by a short-pulse laser for pump-probe characterization of warm dense matter},
author = {McGuffey, C. and Dozières, M. and Kim, J. and Savin, A. and Park, J. and Emig, J. and Brabetz, C. and Carlson, L. and Heeter, R. F. and McLean, H. S. and Moody, J. and Schneider, M. B. and Wei, M. S. and Beg, F. N.},
abstractNote = {In this paper, we propose a pump-probe X-ray absorption spectroscopy temperature measurement technique appropriate for matter having temperature in the range of 10 to a few 100 eV and density up to solid density. Atomic modeling simulations indicate that for various low- to mid-Z materials in this range the energy and optical depth of bound-bound and bound-free absorption features are sensitive to temperature. We discuss sample thickness and tamp layer considerations. A series of experimental investigations was carried out using a range of laser parameters with pulse duration ≤5 ps and various pure and alloyed materials to identify backlighter sources suitable for the technique.},
doi = {10.1063/1.5039419},
journal = {Review of Scientific Instruments},
number = 10,
volume = 89,
place = {United States},
year = {2018},
month = {10}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

Figures / Tables:

FIG. 2 FIG. 2: Calculated transmission for various thicknesses of solid Al for temperature 1 or 60 eV.

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