Experimental analysis of waveguide-coupled surface-plasmon-polariton cone properties

Journal Article · 26 September 2018 · Analytica Chimica Acta

DOI: https://doi.org/10.1016/j.aca.2018.09.057 · OSTI ID:1481878

Nyamekye, Charles K. A.  ^[1]; Zhu, Qiaochu  ^[2]; Mahmood, Russell  ^[2]; Weibel, Stephen C.  ^[3]; Hillier, Andrew C.  ^[1]; Smith, Emily A.  ^[1]

---

1. Ames Lab. and Iowa State Univ., Ames, IA (United States)
2. Iowa State Univ., Ames, IA (United States)
3. Surface Photonics Inc., Madison, WI (United States)

Experimental data for waveguide-coupled surface-plasmon-polariton (SPP) cones generated from dielectric waveguides is presented. The results demonstrate a simpler route to collect plasmon waveguide resonance (i.e., PWR) data. In the reverse-Kretschmann configuration (illumination from the sample side) and Kretschmann configuration (illumination from the prism side), all the waveguide modes are excited simultaneously with p- or s-polarized incident light, which permits rapid acquisition of PWR data without the need to scan the incident angle or wavelength, in the former configuration. The concentric SPP cone properties depend on the thickness and index of refraction of the waveguide. The angular intensity pattern of the cone is well-matched to simulation results in the reverse-Kretschmann configuration, and is found to be dependent on the polarization of the incident light and the polarization of the waveguide mode. In the Kretschmann geometry, all waveguide-coupled SPP cones are measured at incident angles that produce attenuated light reflectivity. Furthermore, the enhanced electric field produced under total internal reflection allows high signal-to-noise ratio multimodal spectroscopies (e.g., Raman scattering, luminescence) to measure the chemical content of the waveguide film, which traditionally is not measured with PWR.

• Research Organization: Ames Laboratory (AMES), Ames, IA (United States)
• Sponsoring Organization: USDOE Office of Science (SC), Basic Energy Sciences (BES)
• Grant/Contract Number: AC02-07CH11358
• OSTI ID: 1481878
• Alternate ID(s): OSTI ID: 1775567
• Report Number(s): IS-J-9715; PII: S0003267018311619
• Journal Information: Analytica Chimica Acta, Vol. 1048; ISSN 0003-2670
• Publisher: ElsevierCopyright Statement
• Country of Publication: United States
• Language: English