Polarimetry Using Graphene-Integrated Anisotropic Metasurfaces
- Cornell Univ., Ithaca, NY (United States). Dept. of Physics; Cornell University
- Indian Inst. of Technology Hyderabad, Sangareddy, Telangana (India). Dept. of Materials Science and Metallurgical Engineering
- Univ. of Texas, Austin, TX (United States). Dept. of Physics and Center for Nano and Molecular Science and Technology
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Cornell Univ., Ithaca, NY (United States). School of Applied and Engineering Physics
Polarization is one of the important properties of light, and its detection is of significant interest for various fundamental and practical applications. Here, we demonstrate a mid-infrared polarimetry device using a gate-tunable graphene-integrated anisotropic metasurface. The Stokes parameters of the incident light are extracted by sweeping the gate voltage applied to the device and subsequent fitting of the measured reflected intensities. Considering subpicosecond carrier relaxation times in graphene, the polarization measurement rate of our device is governed only by the speed of the gate voltage sweep. Thus, our work serves as a proof-of-principle demonstration for high-speed microscale polarimetric devices.
- Research Organization:
- Cornell Univ., Ithaca, NY (United States)
- Sponsoring Organization:
- National Science Foundation (NSF); US Department of the Navy, Office of Naval Research (ONR); USDOE National Nuclear Security Administration (NNSA)
- Grant/Contract Number:
- NA0003525
- OSTI ID:
- 1480828
- Journal Information:
- ACS Photonics, Journal Name: ACS Photonics Journal Issue: 11 Vol. 5; ISSN 2330-4022
- Publisher:
- American Chemical Society (ACS)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
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