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Title: Uncertainty of Integrated Intensity Following Line Profile Fitting of Multiline Spectra

Abstract

A novel method of determining the total uncertainty in the integrated intensity of fitted emission lines in multi-peaked emission spectra is presented. The proposed method does not require an assumption of the type of line profile to be specified. The absolute difference between a fit and measured spectrum defines the uncertainty of the integrated signal intensity and is subsequently decomposed to determine the uncertainty of each peak in multi-line fits. Decomposition relies on tabulating a weighting factor which describes how each peak contributes to the total integral uncertainty. Applications of this method to quantitative approaches in laser-induced breakdown spectroscopy analysis are described.

Authors:
ORCiD logo [1];  [2];  [3];  [3];  [4]
  1. Univ. of Massachusetts, Lowell, MA (United States); Delaware State Univ., Ringgold, DE (United States)
  2. Delaware State Univ., Ringgold, DE (United States)
  3. Y-12 National Security Complex, Oak Ridge, TN (United States)
  4. Univ. of Massachusetts, Lowell, MA (United States)
Publication Date:
Research Org.:
Oak Ridge Y-12 Plant (Y-12), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1479876
Report Number(s):
IROS6851_1
Journal ID: ISSN 0003-7028
Grant/Contract Number:  
NA0001942
Resource Type:
Accepted Manuscript
Journal Name:
Applied Spectroscopy
Additional Journal Information:
Journal Volume: 72; Journal Issue: 5; Journal ID: ISSN 0003-7028
Publisher:
Society for Applied Spectroscopy
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; Laser-Induced Breakdown Spectroscopy; Uncertainties; Fitting

Citation Formats

Surmick, David M., Boukari, Hacene, Woodward, Jonathan, Stowe, Ashley C., and Melikechi, Noureddine. Uncertainty of Integrated Intensity Following Line Profile Fitting of Multiline Spectra. United States: N. p., 2018. Web. doi:10.1177/0003702818756652.
Surmick, David M., Boukari, Hacene, Woodward, Jonathan, Stowe, Ashley C., & Melikechi, Noureddine. Uncertainty of Integrated Intensity Following Line Profile Fitting of Multiline Spectra. United States. doi:10.1177/0003702818756652.
Surmick, David M., Boukari, Hacene, Woodward, Jonathan, Stowe, Ashley C., and Melikechi, Noureddine. Wed . "Uncertainty of Integrated Intensity Following Line Profile Fitting of Multiline Spectra". United States. doi:10.1177/0003702818756652. https://www.osti.gov/servlets/purl/1479876.
@article{osti_1479876,
title = {Uncertainty of Integrated Intensity Following Line Profile Fitting of Multiline Spectra},
author = {Surmick, David M. and Boukari, Hacene and Woodward, Jonathan and Stowe, Ashley C. and Melikechi, Noureddine},
abstractNote = {A novel method of determining the total uncertainty in the integrated intensity of fitted emission lines in multi-peaked emission spectra is presented. The proposed method does not require an assumption of the type of line profile to be specified. The absolute difference between a fit and measured spectrum defines the uncertainty of the integrated signal intensity and is subsequently decomposed to determine the uncertainty of each peak in multi-line fits. Decomposition relies on tabulating a weighting factor which describes how each peak contributes to the total integral uncertainty. Applications of this method to quantitative approaches in laser-induced breakdown spectroscopy analysis are described.},
doi = {10.1177/0003702818756652},
journal = {Applied Spectroscopy},
number = 5,
volume = 72,
place = {United States},
year = {2018},
month = {2}
}

Journal Article:
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