Uncertainty of Integrated Intensity Following Line Profile Fitting of Multiline Spectra
Journal Article
·
· Applied Spectroscopy
- Univ. of Massachusetts, Lowell, MA (United States); Delaware State Univ., Ringgold, DE (United States)
- Delaware State Univ., Ringgold, DE (United States)
- Y-12 National Security Complex, Oak Ridge, TN (United States)
- Univ. of Massachusetts, Lowell, MA (United States)
A novel method of determining the total uncertainty in the integrated intensity of fitted emission lines in multi-peaked emission spectra is presented. The proposed method does not require an assumption of the type of line profile to be specified. The absolute difference between a fit and measured spectrum defines the uncertainty of the integrated signal intensity and is subsequently decomposed to determine the uncertainty of each peak in multi-line fits. Decomposition relies on tabulating a weighting factor which describes how each peak contributes to the total integral uncertainty. Applications of this method to quantitative approaches in laser-induced breakdown spectroscopy analysis are described.
- Research Organization:
- Oak Ridge Y-12 Plant (Y-12), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE
- Grant/Contract Number:
- NA0001942
- OSTI ID:
- 1479876
- Report Number(s):
- IROS6851_1
- Journal Information:
- Applied Spectroscopy, Vol. 72, Issue 5; ISSN 0003-7028
- Publisher:
- Society for Applied SpectroscopyCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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