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Title: Uncertainty of Integrated Intensity Following Line Profile Fitting of Multiline Spectra

Journal Article · · Applied Spectroscopy
ORCiD logo [1];  [2];  [3];  [3];  [4]
  1. Univ. of Massachusetts, Lowell, MA (United States); Delaware State Univ., Ringgold, DE (United States)
  2. Delaware State Univ., Ringgold, DE (United States)
  3. Y-12 National Security Complex, Oak Ridge, TN (United States)
  4. Univ. of Massachusetts, Lowell, MA (United States)

A novel method of determining the total uncertainty in the integrated intensity of fitted emission lines in multi-peaked emission spectra is presented. The proposed method does not require an assumption of the type of line profile to be specified. The absolute difference between a fit and measured spectrum defines the uncertainty of the integrated signal intensity and is subsequently decomposed to determine the uncertainty of each peak in multi-line fits. Decomposition relies on tabulating a weighting factor which describes how each peak contributes to the total integral uncertainty. Applications of this method to quantitative approaches in laser-induced breakdown spectroscopy analysis are described.

Research Organization:
Oak Ridge Y-12 Plant (Y-12), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE
Grant/Contract Number:
NA0001942
OSTI ID:
1479876
Report Number(s):
IROS6851_1
Journal Information:
Applied Spectroscopy, Vol. 72, Issue 5; ISSN 0003-7028
Publisher:
Society for Applied SpectroscopyCopyright Statement
Country of Publication:
United States
Language:
English

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Figures / Tables (4)