Uncertainty of Integrated Intensity Following Line Profile Fitting of Multiline Spectra

Surmick, David M.; Boukari, Hacene; Woodward, Jonathan; Stowe, Ashley C.; Melikechi, Noureddine

doi:10.1177/0003702818756652

Title: Uncertainty of Integrated Intensity Following Line Profile Fitting of Multiline Spectra

Journal Article · 21 February 2018 · Applied Spectroscopy

DOI: https://doi.org/10.1177/0003702818756652 · OSTI ID:1479876

^[1]; Boukari, Hacene ^[2]; Woodward, Jonathan ^[3]; Stowe, Ashley C. ^[3]; Melikechi, Noureddine ^[4]

Univ. of Massachusetts, Lowell, MA (United States); Delaware State Univ., Ringgold, DE (United States)
Delaware State Univ., Ringgold, DE (United States)
Y-12 National Security Complex, Oak Ridge, TN (United States)
Univ. of Massachusetts, Lowell, MA (United States)

A novel method of determining the total uncertainty in the integrated intensity of fitted emission lines in multi-peaked emission spectra is presented. The proposed method does not require an assumption of the type of line profile to be specified. The absolute difference between a fit and measured spectrum defines the uncertainty of the integrated signal intensity and is subsequently decomposed to determine the uncertainty of each peak in multi-line fits. Decomposition relies on tabulating a weighting factor which describes how each peak contributes to the total integral uncertainty. Applications of this method to quantitative approaches in laser-induced breakdown spectroscopy analysis are described.

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Research Organization:: Oak Ridge Y-12 Plant (Y-12), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: NA0001942

OSTI ID:: 1479876

Report Number(s):: IROS6851_1

Journal Information:: Applied Spectroscopy, Vol. 72, Issue 5; ISSN 0003-7028

Publisher:: Society for Applied SpectroscopyCopyright Statement

Country of Publication:: United States

Language:: English

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