Uncertainty of Integrated Intensity Following Line Profile Fitting of Multiline Spectra
Abstract
A novel method of determining the total uncertainty in the integrated intensity of fitted emission lines in multi-peaked emission spectra is presented. The proposed method does not require an assumption of the type of line profile to be specified. The absolute difference between a fit and measured spectrum defines the uncertainty of the integrated signal intensity and is subsequently decomposed to determine the uncertainty of each peak in multi-line fits. Decomposition relies on tabulating a weighting factor which describes how each peak contributes to the total integral uncertainty. Applications of this method to quantitative approaches in laser-induced breakdown spectroscopy analysis are described.
- Authors:
-
[1];
- Univ. of Massachusetts, Lowell, MA (United States); Delaware State Univ., Ringgold, DE (United States)
- Delaware State Univ., Ringgold, DE (United States)
- Y-12 National Security Complex, Oak Ridge, TN (United States)
- Univ. of Massachusetts, Lowell, MA (United States)
- Publication Date:
- Research Org.:
- Oak Ridge Y-12 Plant (Y-12), Oak Ridge, TN (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1479876
- Report Number(s):
- IROS6851_1
Journal ID: ISSN 0003-7028
- Grant/Contract Number:
- NA0001942
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Applied Spectroscopy
- Additional Journal Information:
- Journal Volume: 72; Journal Issue: 5; Journal ID: ISSN 0003-7028
- Publisher:
- Society for Applied Spectroscopy
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; Laser-Induced Breakdown Spectroscopy; Uncertainties; Fitting
Citation Formats
Surmick, David M., Boukari, Hacene, Woodward, Jonathan, Stowe, Ashley C., and Melikechi, Noureddine. Uncertainty of Integrated Intensity Following Line Profile Fitting of Multiline Spectra. United States: N. p., 2018.
Web. doi:10.1177/0003702818756652.
Surmick, David M., Boukari, Hacene, Woodward, Jonathan, Stowe, Ashley C., & Melikechi, Noureddine. Uncertainty of Integrated Intensity Following Line Profile Fitting of Multiline Spectra. United States. https://doi.org/10.1177/0003702818756652
Surmick, David M., Boukari, Hacene, Woodward, Jonathan, Stowe, Ashley C., and Melikechi, Noureddine. Wed .
"Uncertainty of Integrated Intensity Following Line Profile Fitting of Multiline Spectra". United States. https://doi.org/10.1177/0003702818756652. https://www.osti.gov/servlets/purl/1479876.
@article{osti_1479876,
title = {Uncertainty of Integrated Intensity Following Line Profile Fitting of Multiline Spectra},
author = {Surmick, David M. and Boukari, Hacene and Woodward, Jonathan and Stowe, Ashley C. and Melikechi, Noureddine},
abstractNote = {A novel method of determining the total uncertainty in the integrated intensity of fitted emission lines in multi-peaked emission spectra is presented. The proposed method does not require an assumption of the type of line profile to be specified. The absolute difference between a fit and measured spectrum defines the uncertainty of the integrated signal intensity and is subsequently decomposed to determine the uncertainty of each peak in multi-line fits. Decomposition relies on tabulating a weighting factor which describes how each peak contributes to the total integral uncertainty. Applications of this method to quantitative approaches in laser-induced breakdown spectroscopy analysis are described.},
doi = {10.1177/0003702818756652},
journal = {Applied Spectroscopy},
number = 5,
volume = 72,
place = {United States},
year = {2018},
month = {2}
}
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Figures / Tables:
Figure 1: Nonlinear fitting result of Al 256.79 and 257.50 nm transitions collected in a time and space integrated spectral measurement following ablation of an Al alloy 7050 target in ambient laboratory air.
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Figures / Tables found in this record:
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