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Title: PIND: High spatial resolution by pinhole neutron diffraction

Here, a pinhole neutron diffraction (PIND) technique was developed to enable improving the spatial resolution down to 250 μm. Instead of the conventional engineering diffraction method which integrates all the diffraction signals on the detector plane, the PIND setup utilizes the diffraction pattern of each pixel on 2D detectors. The proposed PIND arrangement enables improving the spatial resolution of time-of-flight instruments and allows solving problems involving steep gradients of strain or texture. The phase content and preferential orientation of grains inside samples can be spatially resolved in 2D/3D. Further, PIND retains the capability of in-situ non-destructive neutron diffraction mapping of lattice strain and grain orientation under external stimuli such as temperature and force.
Authors:
ORCiD logo [1] ; ORCiD logo [1] ;  [1] ; ORCiD logo [1] ;  [1] ; ORCiD logo [1]
  1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Publication Date:
Grant/Contract Number:
AC05-00OR22725; LDRD-6789
Type:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 112; Journal Issue: 25; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Research Org:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS
OSTI Identifier:
1479785
Alternate Identifier(s):
OSTI ID: 1454666

Wu, Wei, Stoica, Alexandru Dan, Berry, Kevin D., Frost, Matthew J., Skorpenske, Harley David, and An, Ke. PIND: High spatial resolution by pinhole neutron diffraction. United States: N. p., Web. doi:10.1063/1.5026066.
Wu, Wei, Stoica, Alexandru Dan, Berry, Kevin D., Frost, Matthew J., Skorpenske, Harley David, & An, Ke. PIND: High spatial resolution by pinhole neutron diffraction. United States. doi:10.1063/1.5026066.
Wu, Wei, Stoica, Alexandru Dan, Berry, Kevin D., Frost, Matthew J., Skorpenske, Harley David, and An, Ke. 2018. "PIND: High spatial resolution by pinhole neutron diffraction". United States. doi:10.1063/1.5026066.
@article{osti_1479785,
title = {PIND: High spatial resolution by pinhole neutron diffraction},
author = {Wu, Wei and Stoica, Alexandru Dan and Berry, Kevin D. and Frost, Matthew J. and Skorpenske, Harley David and An, Ke},
abstractNote = {Here, a pinhole neutron diffraction (PIND) technique was developed to enable improving the spatial resolution down to 250 μm. Instead of the conventional engineering diffraction method which integrates all the diffraction signals on the detector plane, the PIND setup utilizes the diffraction pattern of each pixel on 2D detectors. The proposed PIND arrangement enables improving the spatial resolution of time-of-flight instruments and allows solving problems involving steep gradients of strain or texture. The phase content and preferential orientation of grains inside samples can be spatially resolved in 2D/3D. Further, PIND retains the capability of in-situ non-destructive neutron diffraction mapping of lattice strain and grain orientation under external stimuli such as temperature and force.},
doi = {10.1063/1.5026066},
journal = {Applied Physics Letters},
number = 25,
volume = 112,
place = {United States},
year = {2018},
month = {6}
}

Works referenced in this record:

Three-dimensional X-ray structural microscopy with submicrometre resolution
journal, February 2002
  • Larson, B. C.; Yang, Wenge; Ice, G. E.
  • Nature, Vol. 415, p. 887-890
  • DOI: 10.1038/415887a