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Title: Ab initio structure determination from experimental fluctuation X-ray scattering data

Authors:
; ; ; ; ; ;
Publication Date:
Research Org.:
SLAC National Accelerator Lab., Menlo Park, CA (United States); Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1479619
Alternate Identifier(s):
OSTI ID: 1490637; OSTI ID: 1493266
Grant/Contract Number:  
AC02-05CH11231; AC02-76SF00515; R01GM109019
Resource Type:
Published Article
Journal Name:
Proceedings of the National Academy of Sciences of the United States of America
Additional Journal Information:
Journal Name: Proceedings of the National Academy of Sciences of the United States of America Journal Volume: 115 Journal Issue: 46; Journal ID: ISSN 0027-8424
Publisher:
National Academy of Sciences, Washington, DC (United States)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; fluctuation X-ray scattering; small-angle scattering; free-electron laser

Citation Formats

Pande, Kanupriya, Donatelli, Jeffrey J., Malmerberg, Erik, Foucar, Lutz, Bostedt, Christoph, Schlichting, Ilme, and Zwart, Petrus H. Ab initio structure determination from experimental fluctuation X-ray scattering data. United States: N. p., 2018. Web. doi:10.1073/pnas.1812064115.
Pande, Kanupriya, Donatelli, Jeffrey J., Malmerberg, Erik, Foucar, Lutz, Bostedt, Christoph, Schlichting, Ilme, & Zwart, Petrus H. Ab initio structure determination from experimental fluctuation X-ray scattering data. United States. doi:10.1073/pnas.1812064115.
Pande, Kanupriya, Donatelli, Jeffrey J., Malmerberg, Erik, Foucar, Lutz, Bostedt, Christoph, Schlichting, Ilme, and Zwart, Petrus H. Mon . "Ab initio structure determination from experimental fluctuation X-ray scattering data". United States. doi:10.1073/pnas.1812064115.
@article{osti_1479619,
title = {Ab initio structure determination from experimental fluctuation X-ray scattering data},
author = {Pande, Kanupriya and Donatelli, Jeffrey J. and Malmerberg, Erik and Foucar, Lutz and Bostedt, Christoph and Schlichting, Ilme and Zwart, Petrus H.},
abstractNote = {},
doi = {10.1073/pnas.1812064115},
journal = {Proceedings of the National Academy of Sciences of the United States of America},
number = 46,
volume = 115,
place = {United States},
year = {2018},
month = {10}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1073/pnas.1812064115

Citation Metrics:
Cited by: 1 work
Citation information provided by
Web of Science

Figures / Tables:

Fig. 1 Fig. 1: (A and B) An FXS experiment is performed by taking femtosecond Xray diffraction snapshots of particles in solution (A) and computing angular intensity correlations over many images (B). The diffraction patterns consist of data collected on two detector pairs, the so-called back and front detectors, named after theirmore » location relative to the sample, capturing both the low and higher angular sections of the data. Artifacts, such as high-intensity streaks originating from the interface between the liquid jet and vacuum of the experimental chamber (depicted as yellow overloaded pixels), are present on both pairs and need to be identified and masked out before computing correlations.« less

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    Works referencing / citing this record:

    Fluctuation X-ray scattering from nanorods in solution reveals weak temperature-dependent orientational ordering
    journal, May 2019


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