Ab initio structure determination from experimental fluctuation X-ray scattering data

Pande, Kanupriya; Donatelli, Jeffrey J.; Malmerberg, Erik; Foucar, Lutz; Bostedt, Christoph; Schlichting, Ilme; Zwart, Petrus H.

doi:10.1073/pnas.1812064115

Title: Ab initio structure determination from experimental fluctuation X-ray scattering data

Journal Article · 29 October 2018 · Proceedings of the National Academy of Sciences of the United States of America

DOI: https://doi.org/10.1073/pnas.1812064115 · OSTI ID:1479619

Pande, Kanupriya; Donatelli, Jeffrey J.; Malmerberg, Erik; Foucar, Lutz; Bostedt, Christoph; Schlichting, Ilme; Zwart, Petrus H.

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Sponsoring Organization:: USDOE

Grant/Contract Number:: AC02-05CH11231; AC02-76SF00515

OSTI ID:: 1479619

Journal Information:: Proceedings of the National Academy of Sciences of the United States of America, Journal Name: Proceedings of the National Academy of Sciences of the United States of America Journal Issue: 46 Vol. 115; ISSN 0027-8424

Publisher:: National Academy of Sciences, Washington, DC (United States)Copyright Statement

Country of Publication:: United States

Language:: English

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