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Title: Characterization of shaped Bragg crystal assemblies for narrowband x-ray imaging

X-ray imaging using shaped crystals in Bragg reflection is a powerful technique used in high-energy-density physics experiments. The characterization of these crystal assemblies with conventional x-ray sources is very difficult because of the required angular resolution of the order of ~10 μrad and the narrow bandwidth of the crystal. The 10-J, 1-ps Multi-Terawatt (MTW) laser at the Laboratory for Laser Energetics was used to characterize a set of Bragg crystal assemblies. The small spot size (of the order of 5 μm) and the high power (>10 18 W/cm 2) of this laser make it possible to measure the spatial resolution at the intended photon energy. A set of six crystals from two different vendors was checked on MTW, showing an unexpectedly large variation in spatial resolution of up to a factor of 4.
Authors:
 [1] ;  [1] ; ORCiD logo [1] ;  [1] ; ORCiD logo [2] ;  [1] ;  [1] ;  [1]
  1. Univ. of Rochester, NY (United States). Lab. for Laser Energetics
  2. Ecopulse, Inc., Springfield, VA (United States)
Publication Date:
Report Number(s):
2017-267, 1446
Journal ID: ISSN 0034-6748; 2017-267, 2404, 1446
Grant/Contract Number:
NA0001944
Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 89; Journal Issue: 10; Conference: 22nd Topical Conference on High Temperature Plasma Diagnostics, San Diego, CA, 16-19 April 2018; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Research Org:
Univ. of Rochester, NY (United States). Lab. for Laser Energetics
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION
OSTI Identifier:
1479284
Alternate Identifier(s):
OSTI ID: 1477911

Stoeckl, C., Filkins, T., Jungquist, R., Mileham, C., Pereira, N. R., Regan, S. P., Shoup, M. J., and Theobald, W.. Characterization of shaped Bragg crystal assemblies for narrowband x-ray imaging. United States: N. p., Web. doi:10.1063/1.5036525.
Stoeckl, C., Filkins, T., Jungquist, R., Mileham, C., Pereira, N. R., Regan, S. P., Shoup, M. J., & Theobald, W.. Characterization of shaped Bragg crystal assemblies for narrowband x-ray imaging. United States. doi:10.1063/1.5036525.
Stoeckl, C., Filkins, T., Jungquist, R., Mileham, C., Pereira, N. R., Regan, S. P., Shoup, M. J., and Theobald, W.. 2018. "Characterization of shaped Bragg crystal assemblies for narrowband x-ray imaging". United States. doi:10.1063/1.5036525.
@article{osti_1479284,
title = {Characterization of shaped Bragg crystal assemblies for narrowband x-ray imaging},
author = {Stoeckl, C. and Filkins, T. and Jungquist, R. and Mileham, C. and Pereira, N. R. and Regan, S. P. and Shoup, M. J. and Theobald, W.},
abstractNote = {X-ray imaging using shaped crystals in Bragg reflection is a powerful technique used in high-energy-density physics experiments. The characterization of these crystal assemblies with conventional x-ray sources is very difficult because of the required angular resolution of the order of ~10 μrad and the narrow bandwidth of the crystal. The 10-J, 1-ps Multi-Terawatt (MTW) laser at the Laboratory for Laser Energetics was used to characterize a set of Bragg crystal assemblies. The small spot size (of the order of 5 μm) and the high power (>1018 W/cm2) of this laser make it possible to measure the spatial resolution at the intended photon energy. A set of six crystals from two different vendors was checked on MTW, showing an unexpectedly large variation in spatial resolution of up to a factor of 4.},
doi = {10.1063/1.5036525},
journal = {Review of Scientific Instruments},
number = 10,
volume = 89,
place = {United States},
year = {2018},
month = {10}
}

Works referenced in this record:

4.5- and 8-keV emission and absorption x-ray imaging using spherically bent quartz 203 and 211 crystals (invited)
journal, March 2003
  • Koch, J. A.; Aglitskiy, Y.; Brown, C.
  • Review of Scientific Instruments, Vol. 74, Issue 3, p. 2130-2135
  • DOI: 10.1063/1.1537448