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Title: X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry

Authors:
 [1] ;  [2] ;  [1] ;  [3] ;  [3] ;  [3] ;  [3] ;  [2] ;  [2] ;  [3] ;  [4] ; ORCiD logo [4] ;  [4] ;  [4] ;  [5] ;  [4] ; ORCiD logo [6]
  1. Department of Physics and Astronomy, Johns Hopkins University, Baltimore, Maryland 21218, USA
  2. Instituto de Física, Pontificia Universidad Católica de Chile, Casilla 306, Santiago, Chile
  3. Laboratory for Laser Energetics, University of Rochester, Rochester, New York 14623, USA
  4. Laboratoire pour l’Utilisation de Lasers Intenses, CNRS CEA, Ecole Polytechnique, 91128 Palaiseau Cedex, France
  5. Joint Institute for High Temperatures, Russian Academy of Sciences, Moscow 125412, Russia
  6. Université de Bordeaux-CNRS-CEA, CELIA, UMR 5107, F-33405 Talence, France
Publication Date:
Grant/Contract Number:
NA0002955
Type:
Publisher's Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Name: Review of Scientific Instruments Journal Volume: 89 Journal Issue: 10; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1479133

Valdivia, M. P., Veloso, F., Stutman, D., Stoeckl, C., Mileham, C., Begishev, I. A., Theobald, W., Vescovi, M., Useche, W., Regan, S. P., Albertazzi, B., Rigon, G., Mabey, P., Michel, T., Pikuz, S. A., Koenig, M., and Casner, A.. X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry. United States: N. p., Web. doi:10.1063/1.5039342.
Valdivia, M. P., Veloso, F., Stutman, D., Stoeckl, C., Mileham, C., Begishev, I. A., Theobald, W., Vescovi, M., Useche, W., Regan, S. P., Albertazzi, B., Rigon, G., Mabey, P., Michel, T., Pikuz, S. A., Koenig, M., & Casner, A.. X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry. United States. doi:10.1063/1.5039342.
Valdivia, M. P., Veloso, F., Stutman, D., Stoeckl, C., Mileham, C., Begishev, I. A., Theobald, W., Vescovi, M., Useche, W., Regan, S. P., Albertazzi, B., Rigon, G., Mabey, P., Michel, T., Pikuz, S. A., Koenig, M., and Casner, A.. 2018. "X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry". United States. doi:10.1063/1.5039342.
@article{osti_1479133,
title = {X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry},
author = {Valdivia, M. P. and Veloso, F. and Stutman, D. and Stoeckl, C. and Mileham, C. and Begishev, I. A. and Theobald, W. and Vescovi, M. and Useche, W. and Regan, S. P. and Albertazzi, B. and Rigon, G. and Mabey, P. and Michel, T. and Pikuz, S. A. and Koenig, M. and Casner, A.},
abstractNote = {},
doi = {10.1063/1.5039342},
journal = {Review of Scientific Instruments},
number = 10,
volume = 89,
place = {United States},
year = {2018},
month = {10}
}

Works referenced in this record:

Phase retrieval and differential phase-contrast imaging with low-brilliance X-ray sources
journal, March 2006
  • Pfeiffer, Franz; Weitkamp, Timm; Bunk, Oliver
  • Nature Physics, Vol. 2, Issue 4, p. 258-261
  • DOI: 10.1038/nphys265

XWFP: an x-ray wavefront propagation software package for the IDL computer language
conference, October 2004