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Title: Characterization of shaped Bragg crystal assemblies for narrowband x-ray imaging

Abstract

X-ray imaging using shaped crystals in Bragg reflection is a powerful technique used in high-energy-density physics experiments. The characterization of these crystal assemblies with conventional x-ray sources is very difficult because of the required angular resolution of the order of ~10 μrad and the narrow bandwidth of the crystal. The 10-J, 1-ps Multi-Terawatt (MTW) laser at the Laboratory for Laser Energetics was used to characterize a set of Bragg crystal assemblies. The small spot size (of the order of 5 μm) and the high power (>1018 W/cm2) of this laser make it possible to measure the spatial resolution at the intended photon energy. A set of six crystals from two different vendors was checked on MTW, showing an unexpectedly large variation in spatial resolution of up to a factor of 4.

Authors:
 [1];  [1]; ORCiD logo [1];  [1]; ORCiD logo [2];  [1];  [1];  [1]
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  1. Univ. of Rochester, NY (United States). Lab. for Laser Energetics
  2. Ecopulse, Inc., Springfield, VA (United States)
Publication Date:
Research Org.:
Univ. of Rochester, NY (United States). Lab. for Laser Energetics
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1479284
Alternate Identifier(s):
OSTI ID: 1477911
Report Number(s):
2017-267, 1446
Journal ID: ISSN 0034-6748; 2017-267, 2404, 1446
Grant/Contract Number:  
NA0001944
Resource Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 89; Journal Issue: 10; Conference: 22nd Topical Conference on High Temperature Plasma Diagnostics, San Diego, CA, 16-19 April 2018; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Stoeckl, C., Filkins, T., Jungquist, R., Mileham, C., Pereira, N. R., Regan, S. P., Shoup, M. J., and Theobald, W. Characterization of shaped Bragg crystal assemblies for narrowband x-ray imaging. United States: N. p., 2018. Web. doi:10.1063/1.5036525.
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Stoeckl, C., Filkins, T., Jungquist, R., Mileham, C., Pereira, N. R., Regan, S. P., Shoup, M. J., & Theobald, W. Characterization of shaped Bragg crystal assemblies for narrowband x-ray imaging. United States. https://doi.org/10.1063/1.5036525
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Stoeckl, C., Filkins, T., Jungquist, R., Mileham, C., Pereira, N. R., Regan, S. P., Shoup, M. J., and Theobald, W. Wed . "Characterization of shaped Bragg crystal assemblies for narrowband x-ray imaging". United States. https://doi.org/10.1063/1.5036525. https://www.osti.gov/servlets/purl/1479284.
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@article{osti_1479284,
title = {Characterization of shaped Bragg crystal assemblies for narrowband x-ray imaging},
author = {Stoeckl, C. and Filkins, T. and Jungquist, R. and Mileham, C. and Pereira, N. R. and Regan, S. P. and Shoup, M. J. and Theobald, W.},
abstractNote = {X-ray imaging using shaped crystals in Bragg reflection is a powerful technique used in high-energy-density physics experiments. The characterization of these crystal assemblies with conventional x-ray sources is very difficult because of the required angular resolution of the order of ~10 μrad and the narrow bandwidth of the crystal. The 10-J, 1-ps Multi-Terawatt (MTW) laser at the Laboratory for Laser Energetics was used to characterize a set of Bragg crystal assemblies. The small spot size (of the order of 5 μm) and the high power (>1018 W/cm2) of this laser make it possible to measure the spatial resolution at the intended photon energy. A set of six crystals from two different vendors was checked on MTW, showing an unexpectedly large variation in spatial resolution of up to a factor of 4.},
doi = {10.1063/1.5036525},
journal = {Review of Scientific Instruments},
number = 10,
volume = 89,
place = {United States},
year = {Wed Oct 17 00:00:00 EDT 2018},
month = {Wed Oct 17 00:00:00 EDT 2018}
}
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Journal Article:
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Publisher's Version of Record
https://doi.org/10.1063/1.5036525
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Cited by: 6 works
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Figures / Tables:

FIG. 1 FIG. 1: Schematic of the shaped crystal imager setup.
All figures and tables (8 total)
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Works referenced in this record:

Soft x-ray backlighting of cryogenic implosions using a narrowband crystal imaging system (invited)
journal, November 2014

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Experimental Study of the Spatial Resolution of a Spherical Quartz Crystal for X rays at a Wavelength of 8.42 Å
journal, March 2004

Evaluation of bent-crystal x-ray backlighting and microscopy techniques for the Sandia Z machine
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journal, December 2016

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A spherical crystal imager for OMEGA EP
journal, March 2012

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journal, January 2001

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X-Ray Studies of Surface Layers of Crystals
journal, January 1946

Characterization of a picosecond laser generated 4.5keV TiK-alpha source for pulsed radiography
journal, July 2005

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  • Review of Scientific Instruments, Vol. 76, Issue 7
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    Works referencing / citing this record:

    On evaluating x-ray imaging crystals with synchrotron radiation
    journal, October 2018

    • Pereira, N. R.; Macrander, A. T.; Stoeckl, C.
    • Review of Scientific Instruments, Vol. 89, Issue 10
    • DOI: 10.1063/1.5045569
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      Figures / Tables found in this record:

      FIG. 1 (p. 2)figure
      FIG. 2 (p. 2)figure
      FIG. 3 (p. 3)figure
      FIG. 4 (p. 3)figure
      FIG. 5 (p. 3)figure
      FIG. 6 (p. 4)figure
      FIG. 7 (p. 4)figure
      FIG. 8 (p. 4)figure
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