Luminescence methodology to determine grain-boundary, grain-interior, and surface recombination in thin-film solar cells
Abstract
We determine the grain-boundary (GB) recombination velocity, SGB, and grain-interior (GI) lifetime, tGI, parameters in superstrate CdS/CdTe thin-film solar cell technology by combining cathodoluminescence (CL) spectrum imaging and time-resolved photoluminescence (TRPL) measurements. We consider critical device formation stages, including after CdTe deposition, CdCl2 treatment, and Cu diffusion. CL image analysis methods extract GB and GI intensities and grain size for hundreds of grains per sample. Concurrently, a three-dimensional CL model is developed to simulate the GI intensity as a function of tGI, SGB, grain size, and the surface recombination velocity, Ssurf. TRPL measurements provide an estimate of Ssurf for the CL model. A fit of GI intensity vs. grain size data with the CL model gives a self-consistent and representative set of SGB and tGI values for the samples: SGB (tGI) = 2.6 x 106 cm/s (68-250 ps), SGB(tGI) = 4.1 x 105 cm/s (1.5-3.3 ns), and SGB (tGI) = 5.5 x 105 cm/s (1.0-3.8 ns) for as-deposited, CdCl2-treated, and CdCl2- A nd Cu-treated samples, respectively. Thus, we find that the CdCl2 treatment both helps to passivate GBs and significantly increase the GI lifetime. Subsequent Cu diffusion increases GB recombination slightly and has nuanced effects on the GI lifetime. Finally,more »
- Authors:
-
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Centre for Nanoscience and Nanotechnology, CNRS, University Paris-Sud/Paris-Saclay, 91460 Marcoussis, France
- Univ. of Paris-Sud, Orsay (France)
- Publication Date:
- Research Org.:
- National Renewable Energy Laboratory (NREL), Golden, CO (United States)
- Sponsoring Org.:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
- OSTI Identifier:
- 1477833
- Alternate Identifier(s):
- OSTI ID: 1471258
- Report Number(s):
- NREL/JA-5K00-71546
Journal ID: ISSN 0021-8979
- Grant/Contract Number:
- AC36-08GO28308; 30297; 30300
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Journal of Applied Physics
- Additional Journal Information:
- Journal Volume: 124; Journal Issue: 11; Journal ID: ISSN 0021-8979
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 14 SOLAR ENERGY; 36 MATERIALS SCIENCE; thin films; luminescence; solar cells; semiconductors; scanning electron microscopy; crystallographic defects; electrical properties and parameters
Citation Formats
Moseley, John, Rale, Pierre, Collin, Stéphane, Colegrove, Eric, Guthrey, Harvey, Kuciauskas, Darius, Moutinho, Helio, Al-Jassim, Mowafak, and Metzger, Wyatt K. Luminescence methodology to determine grain-boundary, grain-interior, and surface recombination in thin-film solar cells. United States: N. p., 2018.
Web. doi:10.1063/1.5042532.
Moseley, John, Rale, Pierre, Collin, Stéphane, Colegrove, Eric, Guthrey, Harvey, Kuciauskas, Darius, Moutinho, Helio, Al-Jassim, Mowafak, & Metzger, Wyatt K. Luminescence methodology to determine grain-boundary, grain-interior, and surface recombination in thin-film solar cells. United States. https://doi.org/10.1063/1.5042532
Moseley, John, Rale, Pierre, Collin, Stéphane, Colegrove, Eric, Guthrey, Harvey, Kuciauskas, Darius, Moutinho, Helio, Al-Jassim, Mowafak, and Metzger, Wyatt K. Tue .
"Luminescence methodology to determine grain-boundary, grain-interior, and surface recombination in thin-film solar cells". United States. https://doi.org/10.1063/1.5042532. https://www.osti.gov/servlets/purl/1477833.
@article{osti_1477833,
title = {Luminescence methodology to determine grain-boundary, grain-interior, and surface recombination in thin-film solar cells},
author = {Moseley, John and Rale, Pierre and Collin, Stéphane and Colegrove, Eric and Guthrey, Harvey and Kuciauskas, Darius and Moutinho, Helio and Al-Jassim, Mowafak and Metzger, Wyatt K.},
abstractNote = {We determine the grain-boundary (GB) recombination velocity, SGB, and grain-interior (GI) lifetime, tGI, parameters in superstrate CdS/CdTe thin-film solar cell technology by combining cathodoluminescence (CL) spectrum imaging and time-resolved photoluminescence (TRPL) measurements. We consider critical device formation stages, including after CdTe deposition, CdCl2 treatment, and Cu diffusion. CL image analysis methods extract GB and GI intensities and grain size for hundreds of grains per sample. Concurrently, a three-dimensional CL model is developed to simulate the GI intensity as a function of tGI, SGB, grain size, and the surface recombination velocity, Ssurf. TRPL measurements provide an estimate of Ssurf for the CL model. A fit of GI intensity vs. grain size data with the CL model gives a self-consistent and representative set of SGB and tGI values for the samples: SGB (tGI) = 2.6 x 106 cm/s (68-250 ps), SGB(tGI) = 4.1 x 105 cm/s (1.5-3.3 ns), and SGB (tGI) = 5.5 x 105 cm/s (1.0-3.8 ns) for as-deposited, CdCl2-treated, and CdCl2- A nd Cu-treated samples, respectively. Thus, we find that the CdCl2 treatment both helps to passivate GBs and significantly increase the GI lifetime. Subsequent Cu diffusion increases GB recombination slightly and has nuanced effects on the GI lifetime. Finally, as a partial check on the SGB and tGI values, they are input to a Sentaurus device model, and the simulated performance is compared to the measured performance. The methodology developed here can be applied broadly to CdTe and CdSeTe thin-film technology and to other thin-film solar cell materials including Cu(In1-xGax)Se2, Cu2ZnSnS4, and perovskites.},
doi = {10.1063/1.5042532},
journal = {Journal of Applied Physics},
number = 11,
volume = 124,
place = {United States},
year = {Tue Sep 18 00:00:00 EDT 2018},
month = {Tue Sep 18 00:00:00 EDT 2018}
}
Web of Science
Figures / Tables:
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Works referencing / citing this record:
Radiative Efficiency and Charge‐Carrier Lifetimes and Diffusion Length in Polycrystalline CdSeTe Heterostructures
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Figures / Tables found in this record: