X-ray diffraction and heterogeneous materials: An adaptive crystallography approach

Dejoie, Catherine; Autran, Pierre -Olivier; Bordet, Pierre; Fitch, Andy N.; Martinetto, Pauline; Sciau, Philippe; Tamura, Nobumichi; Wright, Jonathan

doi:10.1016/j.crhy.2018.09.001

Title: X-ray diffraction and heterogeneous materials: An adaptive crystallography approach

Abstract

Cultural heritage materials are often complex and heterogeneous, with a multi-scale architecture. Phases from a variety of crystalline forms co-exist in a wide grain size distribution, with each of these phases keeping in their structural arrangement a memory of the transformations that occurred to the material. Over the last two decades, X-ray diffraction has been applied successfully to the study of cultural heritage materials, with the use of synchrotron facilities offering new possibilities to describe the structural features of such complex materials. The long-range and/or short-range organization of the different crystallographic phases as well as their global position/dispersion in the material are closely related to the properties of the material (optical, mechanical…), its manufacturing process, functionality, or long-term conservation. In this paper, possible diffraction setups and data collection strategies are discussed in order to retrieve adequate data from crystalline and amorphous phases and to take into account single-crystal contributions.

Authors:

Dejoie, Catherine ^[1]; Autran, Pierre -Olivier ^[2]; Bordet, Pierre ^[3]; Fitch, Andy N. ^[1]; Martinetto, Pauline ^[3]; Sciau, Philippe ^[4]; Tamura, Nobumichi ^[5]; Wright, Jonathan ^[1]

European Synchrotron Radiation Facility, Grenoble (France)
European Synchrotron Radiation Facility, Grenoble (France); Univ. Grenoble Alpes, Grenoble (France)
Univ. Grenoble Alpes, Grenoble (France)
CEMES, Toulouse (France)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)

Publication Date:: Thu Sep 13 00:00:00 EDT 2018

Research Org.:: Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)

Sponsoring Org.:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

OSTI Identifier:: 1477263

Grant/Contract Number:: AC02-05CH11231

Resource Type:: Accepted Manuscript

Journal Name:: Comptes Rendus. Physique

Additional Journal Information:: Journal Volume: 19; Journal Issue: 7; Journal ID: ISSN 1631-0705

Publisher:: Elsevier

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE; Cultural heritage; Heterogeneous materials; X-ray diffraction; Crystalline phases; Amorphous phases; Synchrotron

Citation Formats


                    Dejoie, Catherine, Autran, Pierre -Olivier, Bordet, Pierre, Fitch, Andy N., Martinetto, Pauline, Sciau, Philippe, Tamura, Nobumichi, and Wright, Jonathan. X-ray diffraction and heterogeneous materials: An adaptive crystallography approach.  United States: N. p., 2018. 
Web.  doi:10.1016/j.crhy.2018.09.001.

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                    Dejoie, Catherine, Autran, Pierre -Olivier, Bordet, Pierre, Fitch, Andy N., Martinetto, Pauline, Sciau, Philippe, Tamura, Nobumichi, & Wright, Jonathan. X-ray diffraction and heterogeneous materials: An adaptive crystallography approach.  United States.  https://doi.org/10.1016/j.crhy.2018.09.001

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                    Dejoie, Catherine, Autran, Pierre -Olivier, Bordet, Pierre, Fitch, Andy N., Martinetto, Pauline, Sciau, Philippe, Tamura, Nobumichi, and Wright, Jonathan. Thu .  
"X-ray diffraction and heterogeneous materials: An adaptive crystallography approach".  United States.  https://doi.org/10.1016/j.crhy.2018.09.001.  https://www.osti.gov/servlets/purl/1477263.

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@article{osti_1477263,

  title        = {X-ray diffraction and heterogeneous materials: An adaptive crystallography approach},

  author       = {Dejoie, Catherine and Autran, Pierre -Olivier and Bordet, Pierre and Fitch, Andy N. and Martinetto, Pauline and Sciau, Philippe and Tamura, Nobumichi and Wright, Jonathan},

  abstractNote = {Cultural heritage materials are often complex and heterogeneous, with a multi-scale architecture. Phases from a variety of crystalline forms co-exist in a wide grain size distribution, with each of these phases keeping in their structural arrangement a memory of the transformations that occurred to the material. Over the last two decades, X-ray diffraction has been applied successfully to the study of cultural heritage materials, with the use of synchrotron facilities offering new possibilities to describe the structural features of such complex materials. The long-range and/or short-range organization of the different crystallographic phases as well as their global position/dispersion in the material are closely related to the properties of the material (optical, mechanical…), its manufacturing process, functionality, or long-term conservation. In this paper, possible diffraction setups and data collection strategies are discussed in order to retrieve adequate data from crystalline and amorphous phases and to take into account single-crystal contributions.},

  doi          = {10.1016/j.crhy.2018.09.001},

  journal      = {Comptes Rendus. Physique},

  number       = 7,

  volume       = 19,

  place        = {United States},

  year         = {Thu Sep 13 00:00:00 EDT 2018},

  month        = {Thu Sep 13 00:00:00 EDT 2018}

}

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https://doi.org/10.1016/j.crhy.2018.09.001

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Figures / Tables:

Fig.1: a) Diffraction pattern of ceria measured with a FReLoN 4M 2D detector at the ID11 beamline (ESRF). b) High-resolution powder pattern of silicon (NIST, 640c) measured at the ID22 beamline (ESRF). The instrumental contribution to the full width at half maximum (FWHM) of diffraction peaks is about 0.003◦2θ(Si 111more »

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