The single-line-of-sight, time-resolved x-ray imager diagnostic on OMEGA
- Authors:
-
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- Univ. of Rochester, NY (United States). Lab. for Laser Energetics
- General Atomics, San Diego, CA (United States)
- TMC2 Innovations LLC, Murrieta, CA (United States)
- Kentech Instruments Ltd., Howbery Park, Wallingford, Oxfordshire (United Kingdom)
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Publication Date:
- Research Org.:
- Univ. of Rochester, NY (United States). Lab. for Laser Energetics; Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1477184
- Alternate Identifier(s):
- OSTI ID: 1476688; OSTI ID: 1513107
- Report Number(s):
- 2017-268,1440; LLNL-JRNL-754192
Journal ID: ISSN 0034-6748; 2017-268, 1440, 2398
- Grant/Contract Number:
- NA0001944; FC02-04ER54789; AC52-07NA27344
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Review of Scientific Instruments
- Additional Journal Information:
- Journal Volume: 89; Journal Issue: 10; Conference: 22nd Topical Conference on High Temperature Plasma Diagnostics, San Diego, CA, 16-19 April 2018; Journal ID: ISSN 0034-6748
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; Lasers
Citation Formats
Theobald, W., Sorce, C., Bedzyk, M., Ivancic, S. T., Marshall, F. J., Stoeckl, C., Shah, R. C., Lawrie, M., Regan, S. P., Sangster, T. C., Campbell, E. M., Hilsabeck, T. J., Englehorn, K., Kilkenny, J. D., Morris, D., Chung, T. M., Hares, J. D., Dymoke-Bradshaw, A. K. L., Bell, P., Celeste, J., Carpenter, A. C., Dayton, M., Bradley, D. K., Jackson, M. C., Pickworth, L., Nagel, S. R., Rochau, G., Porter, J., Sanchez, M., Claus, L., Robertson, G., and Looker, Q.. The single-line-of-sight, time-resolved x-ray imager diagnostic on OMEGA. United States: N. p., 2018.
Web. doi:10.1063/1.5036767.
Theobald, W., Sorce, C., Bedzyk, M., Ivancic, S. T., Marshall, F. J., Stoeckl, C., Shah, R. C., Lawrie, M., Regan, S. P., Sangster, T. C., Campbell, E. M., Hilsabeck, T. J., Englehorn, K., Kilkenny, J. D., Morris, D., Chung, T. M., Hares, J. D., Dymoke-Bradshaw, A. K. L., Bell, P., Celeste, J., Carpenter, A. C., Dayton, M., Bradley, D. K., Jackson, M. C., Pickworth, L., Nagel, S. R., Rochau, G., Porter, J., Sanchez, M., Claus, L., Robertson, G., & Looker, Q.. The single-line-of-sight, time-resolved x-ray imager diagnostic on OMEGA. United States. https://doi.org/10.1063/1.5036767
Theobald, W., Sorce, C., Bedzyk, M., Ivancic, S. T., Marshall, F. J., Stoeckl, C., Shah, R. C., Lawrie, M., Regan, S. P., Sangster, T. C., Campbell, E. M., Hilsabeck, T. J., Englehorn, K., Kilkenny, J. D., Morris, D., Chung, T. M., Hares, J. D., Dymoke-Bradshaw, A. K. L., Bell, P., Celeste, J., Carpenter, A. C., Dayton, M., Bradley, D. K., Jackson, M. C., Pickworth, L., Nagel, S. R., Rochau, G., Porter, J., Sanchez, M., Claus, L., Robertson, G., and Looker, Q.. Mon .
"The single-line-of-sight, time-resolved x-ray imager diagnostic on OMEGA". United States. https://doi.org/10.1063/1.5036767. https://www.osti.gov/servlets/purl/1477184.
@article{osti_1477184,
title = {The single-line-of-sight, time-resolved x-ray imager diagnostic on OMEGA},
author = {Theobald, W. and Sorce, C. and Bedzyk, M. and Ivancic, S. T. and Marshall, F. J. and Stoeckl, C. and Shah, R. C. and Lawrie, M. and Regan, S. P. and Sangster, T. C. and Campbell, E. M. and Hilsabeck, T. J. and Englehorn, K. and Kilkenny, J. D. and Morris, D. and Chung, T. M. and Hares, J. D. and Dymoke-Bradshaw, A. K. L. and Bell, P. and Celeste, J. and Carpenter, A. C. and Dayton, M. and Bradley, D. K. and Jackson, M. C. and Pickworth, L. and Nagel, S. R. and Rochau, G. and Porter, J. and Sanchez, M. and Claus, L. and Robertson, G. and Looker, Q.},
abstractNote = {},
doi = {10.1063/1.5036767},
journal = {Review of Scientific Instruments},
number = 10,
volume = 89,
place = {United States},
year = {2018},
month = {10}
}
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Cited by: 19 works
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Works referenced in this record:
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Sub-nanosecond single line-of-sight (SLOS) x-ray imagers (invited)
journal, October 2018
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- Review of Scientific Instruments, Vol. 89, Issue 10
An overview of the Ultrafast X-ray Imager (UXI) program at Sandia Labs
conference, August 2015
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- SPIE Optical Engineering + Applications
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journal, October 2010
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- Review of Scientific Instruments, Vol. 81, Issue 10
A framed, 16-image Kirkpatrick–Baez x-ray microscope
journal, September 2017
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- Review of Scientific Instruments, Vol. 88, Issue 9
Single Line of Sight CMOS radiation tolerant camera system design overview
conference, September 2016
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Works referencing / citing this record:
Sub-nanosecond single line-of-sight (SLOS) x-ray imagers (invited)
journal, October 2018
- Engelhorn, K.; Hilsabeck, T. J.; Kilkenny, J.
- Review of Scientific Instruments, Vol. 89, Issue 10
Inferred UV fluence focal-spot profiles from soft x-ray pinhole-camera measurements on OMEGA
journal, February 2020
- Theobald, W.; Sorce, C.; Donaldson, W. R.
- Review of Scientific Instruments, Vol. 91, Issue 2
The National Direct-Drive Inertial Confinement Fusion Program
journal, December 2018
- Regan, S. P.; Goncharov, V. N.; Sangster, T. C.
- Nuclear Fusion, Vol. 59, Issue 3
Figures / Tables found in this record:
Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.