Resonant inelastic X-ray scattering of tantalum double perovskite structures

doi:10.1016/j.cap.2018.05.014

Title: Resonant inelastic X-ray scattering of tantalum double perovskite structures

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Abstract

In this paper, we investigated the electronic structures and defect states of SrLaMgTaO ₆ (SLMTO) double perovskite structures by using resonant inelastic x-ray scattering. Recently, Eu ³⁺ doped SLMTO red phosphors have been vigorously investigated due to their higher red emission efficiency compared to commercial white light emitting diodes (W-LED). However, a comprehensive understanding on the electronic structures and defect states of host SLMTO compounds, which are specifically related to the W-LED and photoluminescence (PL), is far from complete. Here, we found that the PL spectra of SLMTO powder compounds sintered at a higher temperature, 1400 °C, were weaker in the blue emission regions (at around 400 nm) and became enhanced in near infrared (NIR) regions compared to those sintered at 1200 °C. To elucidate the difference of the PL spectra, we performed resonant inelastic x-ray spectroscopy (RIXS) at Ta L-edge. Here, our RIXS result implies that the microscopic origin of different PL spectra is not relevant to the Ta-related defects and oxygen vacancies.

Authors:

Oh, Ju Hyun ^[1]; Kim, Jung Ho ^[2]; Jeong, Jung Hyun ^[1];

^[3]

Pukyong National Univ., Busan (South Korea)
Argonne National Lab. (ANL), Lemont, IL (United States)
Pukyong National Univ., Busan (South Korea); Chung-Ang Univ., Seoul (South Korea)

Publication Date:: 2018-05-15

Research Org.:: Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Org.:: USDOE Office of Science (SC)

OSTI Identifier:: 1476899

Grant/Contract Number:: [AC02-06CH11357]

Resource Type:: Accepted Manuscript

Journal Name:: Current Applied Physics

Additional Journal Information:: [ Journal Volume: 18; Journal Issue: 11]; Journal ID: ISSN 1567-1739

Publisher:: Korean Physical Society

Country of Publication:: United States

Language:: English

Subject:: 36 MATERIALS SCIENCE; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; Resonant inelastic X-ray scattering; SrLaMgTaO6; Double perovskites; Light emitting diodes

Citation Formats


                    Oh, Ju Hyun, Kim, Jung Ho, Jeong, Jung Hyun, and Chang, Seo Hyoung. Resonant inelastic X-ray scattering of tantalum double perovskite structures.  United States: N. p., 2018. 
        Web.  doi:10.1016/j.cap.2018.05.014.

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                    Oh, Ju Hyun, Kim, Jung Ho, Jeong, Jung Hyun, & Chang, Seo Hyoung. Resonant inelastic X-ray scattering of tantalum double perovskite structures.  United States.  doi:10.1016/j.cap.2018.05.014.

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                    Oh, Ju Hyun, Kim, Jung Ho, Jeong, Jung Hyun, and Chang, Seo Hyoung. Tue .  
        "Resonant inelastic X-ray scattering of tantalum double perovskite structures".  United States.  doi:10.1016/j.cap.2018.05.014.  https://www.osti.gov/servlets/purl/1476899.

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@article{osti_1476899,

  title        = {Resonant inelastic X-ray scattering of tantalum double perovskite structures},

  author       = {Oh, Ju Hyun and Kim, Jung Ho and Jeong, Jung Hyun and Chang, Seo Hyoung},

  abstractNote = {In this paper, we investigated the electronic structures and defect states of SrLaMgTaO6 (SLMTO) double perovskite structures by using resonant inelastic x-ray scattering. Recently, Eu3+ doped SLMTO red phosphors have been vigorously investigated due to their higher red emission efficiency compared to commercial white light emitting diodes (W-LED). However, a comprehensive understanding on the electronic structures and defect states of host SLMTO compounds, which are specifically related to the W-LED and photoluminescence (PL), is far from complete. Here, we found that the PL spectra of SLMTO powder compounds sintered at a higher temperature, 1400 °C, were weaker in the blue emission regions (at around 400 nm) and became enhanced in near infrared (NIR) regions compared to those sintered at 1200 °C. To elucidate the difference of the PL spectra, we performed resonant inelastic x-ray spectroscopy (RIXS) at Ta L-edge. Here, our RIXS result implies that the microscopic origin of different PL spectra is not relevant to the Ta-related defects and oxygen vacancies.},

  doi          = {10.1016/j.cap.2018.05.014},

  journal      = {Current Applied Physics},

  number       = [11],

  volume       = [18],

  place        = {United States},

  year         = {2018},

  month        = {5}

}

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DOI: 10.1016/j.cap.2018.05.014

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