A new synchrotron rapid-scanning X-ray fluorescence (SRS-XRF) imaging station at SSRL beamline 6-2
Abstract
This paper describes a new large-range rapid-scan X-ray fluorescence (XRF) imaging station at beamline 6-2 at the Stanford Synchrotron Radiation Lightsource at SLAC National Accelerator Laboratory. This station uses a continuous rapid-scan system with a scan range of 1000 × 600 mm and a load capacity of up to 25 kg, capable of 25–100 µm resolution elemental XRF mapping and X-ray absorption spectroscopy (XAS) of a wide range of objects. XRF is measured using a four-element Hitachi Vortex ME4 silicon drift detector coupled to a Quantum Detectors Xspress3 multi-channel analyzer system. A custom system allows the X-ray spot size to be changed quickly and easilyviapinholes ranging from 25 to 100 µm, and the use of a poly-capillary or axially symmetric achromatic optic may achieve a <10 µm resolution in the future. The instrument is located at wiggler beamline 6-2 which has an energy range of 2.1–17 keV, creatingKemission for elements up to strontium, andLorMemission for all other elements. XAS can also be performed at selected sample positions within the same experiment, allowing for a more detailed chemical characterization of the elements of interest. Furthermore, sparse excitation energy XRF imaging can be performed over a wide range of incident X-ray energies. User friendliness has been emphasized inmore »
- Authors:
- Publication Date:
- Research Org.:
- SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE Office of Science (SC), Biological and Environmental Research (BER); Petroleum Technology Development Fund (PTDF) (Nigeria); Engineering and Physical Sciences Research Council (EPSRC); Science and Technology Facilities Council (STFC) (United Kingdom); Southern California Earthquake Center (SCEC), Los Angeles, CA (United States); National Science Foundation (NSF); National Institutes of Health (NIH)
- OSTI Identifier:
- 1476844
- Alternate Identifier(s):
- OSTI ID: 1476303
- Grant/Contract Number:
- AC02-76SF00515; P41GM103393; 16PhD153; ST/M001814/1
- Resource Type:
- Published Article
- Journal Name:
- Journal of Synchrotron Radiation (Online)
- Additional Journal Information:
- Journal Name: Journal of Synchrotron Radiation (Online) Journal Volume: 25 Journal Issue: 5; Journal ID: ISSN 1600-5775
- Publisher:
- International Union of Crystallography
- Country of Publication:
- Denmark
- Language:
- English
- Subject:
- 47 OTHER INSTRUMENTATION; synchrotron; X-ray; fossils; fluorescence; imaging
Citation Formats
Edwards, Nicholas P., Webb, Samuel M., Krest, Courtney M., van Campen, Douglas, Manning, Phillip L., Wogelius, Roy A., and Bergmann, Uwe. A new synchrotron rapid-scanning X-ray fluorescence (SRS-XRF) imaging station at SSRL beamline 6-2. Denmark: N. p., 2018.
Web. doi:10.1107/S1600577518010202.
Edwards, Nicholas P., Webb, Samuel M., Krest, Courtney M., van Campen, Douglas, Manning, Phillip L., Wogelius, Roy A., & Bergmann, Uwe. A new synchrotron rapid-scanning X-ray fluorescence (SRS-XRF) imaging station at SSRL beamline 6-2. Denmark. https://doi.org/10.1107/S1600577518010202
Edwards, Nicholas P., Webb, Samuel M., Krest, Courtney M., van Campen, Douglas, Manning, Phillip L., Wogelius, Roy A., and Bergmann, Uwe. Tue .
"A new synchrotron rapid-scanning X-ray fluorescence (SRS-XRF) imaging station at SSRL beamline 6-2". Denmark. https://doi.org/10.1107/S1600577518010202.
@article{osti_1476844,
title = {A new synchrotron rapid-scanning X-ray fluorescence (SRS-XRF) imaging station at SSRL beamline 6-2},
author = {Edwards, Nicholas P. and Webb, Samuel M. and Krest, Courtney M. and van Campen, Douglas and Manning, Phillip L. and Wogelius, Roy A. and Bergmann, Uwe},
abstractNote = {This paper describes a new large-range rapid-scan X-ray fluorescence (XRF) imaging station at beamline 6-2 at the Stanford Synchrotron Radiation Lightsource at SLAC National Accelerator Laboratory. This station uses a continuous rapid-scan system with a scan range of 1000 × 600 mm and a load capacity of up to 25 kg, capable of 25–100 µm resolution elemental XRF mapping and X-ray absorption spectroscopy (XAS) of a wide range of objects. XRF is measured using a four-element Hitachi Vortex ME4 silicon drift detector coupled to a Quantum Detectors Xspress3 multi-channel analyzer system. A custom system allows the X-ray spot size to be changed quickly and easilyviapinholes ranging from 25 to 100 µm, and the use of a poly-capillary or axially symmetric achromatic optic may achieve a <10 µm resolution in the future. The instrument is located at wiggler beamline 6-2 which has an energy range of 2.1–17 keV, creatingKemission for elements up to strontium, andLorMemission for all other elements. XAS can also be performed at selected sample positions within the same experiment, allowing for a more detailed chemical characterization of the elements of interest. Furthermore, sparse excitation energy XRF imaging can be performed over a wide range of incident X-ray energies. User friendliness has been emphasized in all stages of the experiment, including versatile sample mounts, He purged chambers for low-Zanalyses, and intuitive visualization hardware and software. The station provides analysis capabilities for a wide range of materials and research fields including biological, chemical, environmental and materials science, paleontology, geology and cultural heritage.},
doi = {10.1107/S1600577518010202},
journal = {Journal of Synchrotron Radiation (Online)},
number = 5,
volume = 25,
place = {Denmark},
year = {Tue Aug 28 00:00:00 EDT 2018},
month = {Tue Aug 28 00:00:00 EDT 2018}
}
https://doi.org/10.1107/S1600577518010202
Web of Science
Figures / Tables:
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