Synthetic diagnostic for electron cyclotron emission imaging

Journal Article · 01 October 2018 · Review of Scientific Instruments

DOI: https://doi.org/10.1063/1.5035426 · OSTI ID:1476378

Chen, M. ^[1]; Zhu, Y. ^[1]; Luo, C. ^[1]; Shi, L.  ^[2]; Tobias, B. J. ^[3]; Luhmann, Jr., N. C. ^[1]

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1. Department of Electrical and Computer Engineering, University of California, Davis, California 95616, USA
2. Department of Physics and Astronomy, University of California, Irvine, California 92697, USA
3. Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA

Not Available

• Sponsoring Organization: USDOE
• Grant/Contract Number: FG02-99ER54531
• OSTI ID: 1476378
• Journal Information: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 10 Vol. 89; ISSN 0034-6748
• Publisher: American Institute of PhysicsCopyright Statement
• Country of Publication: United States
• Language: English