Secondary ion mass spectrometry for superconducting radiofrequency cavity materials
Abstract
Historically, many advances in superconducting radio frequency (SRF) cavities destined for use in advanced particle accelerators have come empirically, through the iterative procedure of modifying processing and then performance testing. However, material structure is directly responsible for performance. Understanding, the link between processing, structure, and performance will streamline and accelerate the research process. In order to connect processing, structure, and performance, accurate and robust materials characterization methods are needed. Here in this paper, one such method, SIMS, is discussed with focus on analysis of SRF materials. In addition, several examples are presented, showing how SIMS is being used to further understanding of materials based SRF technologies.
- Authors:
-
- Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States)
- College of William and Mary, Williamsburg, VA (United States)
- North Carolina State Univ., Raleigh, NC (United States)
- College of William and Mary, Williamsburg, VA (United States); Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
- Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
- Publication Date:
- Research Org.:
- Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Nuclear Physics (NP)
- OSTI Identifier:
- 1475292
- Report Number(s):
- JLAB-ACC-18-2712; DOE/OR/-23177-4445
Journal ID: ISSN 2166-2746
- Grant/Contract Number:
- SC0014475; AC05-06OR23177
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Journal of Vacuum Science and Technology. B, Nanotechnology and Microelectronics
- Additional Journal Information:
- Journal Volume: 36; Journal Issue: 5; Journal ID: ISSN 2166-2746
- Publisher:
- American Vacuum Society/AIP
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 43 PARTICLE ACCELERATORS
Citation Formats
Tuggle, Jay, Pudasaini, Uttar, Stevie, Fred A., Kelley, Michael J., Palczewski, Ari D., and Reece, Charles E. Secondary ion mass spectrometry for superconducting radiofrequency cavity materials. United States: N. p., 2018.
Web. doi:10.1116/1.5041093.
Tuggle, Jay, Pudasaini, Uttar, Stevie, Fred A., Kelley, Michael J., Palczewski, Ari D., & Reece, Charles E. Secondary ion mass spectrometry for superconducting radiofrequency cavity materials. United States. https://doi.org/10.1116/1.5041093
Tuggle, Jay, Pudasaini, Uttar, Stevie, Fred A., Kelley, Michael J., Palczewski, Ari D., and Reece, Charles E. Wed .
"Secondary ion mass spectrometry for superconducting radiofrequency cavity materials". United States. https://doi.org/10.1116/1.5041093. https://www.osti.gov/servlets/purl/1475292.
@article{osti_1475292,
title = {Secondary ion mass spectrometry for superconducting radiofrequency cavity materials},
author = {Tuggle, Jay and Pudasaini, Uttar and Stevie, Fred A. and Kelley, Michael J. and Palczewski, Ari D. and Reece, Charles E.},
abstractNote = {Historically, many advances in superconducting radio frequency (SRF) cavities destined for use in advanced particle accelerators have come empirically, through the iterative procedure of modifying processing and then performance testing. However, material structure is directly responsible for performance. Understanding, the link between processing, structure, and performance will streamline and accelerate the research process. In order to connect processing, structure, and performance, accurate and robust materials characterization methods are needed. Here in this paper, one such method, SIMS, is discussed with focus on analysis of SRF materials. In addition, several examples are presented, showing how SIMS is being used to further understanding of materials based SRF technologies.},
doi = {10.1116/1.5041093},
journal = {Journal of Vacuum Science and Technology. B, Nanotechnology and Microelectronics},
number = 5,
volume = 36,
place = {United States},
year = {Wed Sep 19 00:00:00 EDT 2018},
month = {Wed Sep 19 00:00:00 EDT 2018}
}
Web of Science
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