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Title: Secondary ion mass spectrometry for superconducting radiofrequency cavity materials

Abstract

Historically, many advances in superconducting radio frequency (SRF) cavities destined for use in advanced particle accelerators have come empirically, through the iterative procedure of modifying processing and then performance testing. However, material structure is directly responsible for performance. Understanding, the link between processing, structure, and performance will streamline and accelerate the research process. In order to connect processing, structure, and performance, accurate and robust materials characterization methods are needed. Here in this paper, one such method, SIMS, is discussed with focus on analysis of SRF materials. In addition, several examples are presented, showing how SIMS is being used to further understanding of materials based SRF technologies.

Authors:
 [1];  [2];  [3];  [4];  [5]; ORCiD logo [5]
  1. Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States)
  2. College of William and Mary, Williamsburg, VA (United States)
  3. North Carolina State Univ., Raleigh, NC (United States)
  4. College of William and Mary, Williamsburg, VA (United States); Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
  5. Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
Publication Date:
Research Org.:
Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Nuclear Physics (NP)
OSTI Identifier:
1475292
Report Number(s):
JLAB-ACC-18-2712; DOE/OR/-23177-4445
Journal ID: ISSN 2166-2746
Grant/Contract Number:  
SC0014475; AC05-06OR23177
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Vacuum Science and Technology. B, Nanotechnology and Microelectronics
Additional Journal Information:
Journal Volume: 36; Journal Issue: 5; Journal ID: ISSN 2166-2746
Publisher:
American Vacuum Society/AIP
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 43 PARTICLE ACCELERATORS

Citation Formats

Tuggle, Jay, Pudasaini, Uttar, Stevie, Fred A., Kelley, Michael J., Palczewski, Ari D., and Reece, Charles E. Secondary ion mass spectrometry for superconducting radiofrequency cavity materials. United States: N. p., 2018. Web. https://doi.org/10.1116/1.5041093.
Tuggle, Jay, Pudasaini, Uttar, Stevie, Fred A., Kelley, Michael J., Palczewski, Ari D., & Reece, Charles E. Secondary ion mass spectrometry for superconducting radiofrequency cavity materials. United States. https://doi.org/10.1116/1.5041093
Tuggle, Jay, Pudasaini, Uttar, Stevie, Fred A., Kelley, Michael J., Palczewski, Ari D., and Reece, Charles E. Wed . "Secondary ion mass spectrometry for superconducting radiofrequency cavity materials". United States. https://doi.org/10.1116/1.5041093. https://www.osti.gov/servlets/purl/1475292.
@article{osti_1475292,
title = {Secondary ion mass spectrometry for superconducting radiofrequency cavity materials},
author = {Tuggle, Jay and Pudasaini, Uttar and Stevie, Fred A. and Kelley, Michael J. and Palczewski, Ari D. and Reece, Charles E.},
abstractNote = {Historically, many advances in superconducting radio frequency (SRF) cavities destined for use in advanced particle accelerators have come empirically, through the iterative procedure of modifying processing and then performance testing. However, material structure is directly responsible for performance. Understanding, the link between processing, structure, and performance will streamline and accelerate the research process. In order to connect processing, structure, and performance, accurate and robust materials characterization methods are needed. Here in this paper, one such method, SIMS, is discussed with focus on analysis of SRF materials. In addition, several examples are presented, showing how SIMS is being used to further understanding of materials based SRF technologies.},
doi = {10.1116/1.5041093},
journal = {Journal of Vacuum Science and Technology. B, Nanotechnology and Microelectronics},
number = 5,
volume = 36,
place = {United States},
year = {2018},
month = {9}
}

Journal Article:
Free Publicly Available Full Text
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Cited by: 1 work
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Figures / Tables:

FIG. 1 FIG. 1: Depth profile of N-doped niobium with EP surface. Specimen was sputter coated with Pt/Pd prior to depth profiling.

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