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Title: Secondary ion mass spectrometry for superconducting radiofrequency cavity materials

Journal Article · · Journal of Vacuum Science and Technology. B, Nanotechnology and Microelectronics
DOI: https://doi.org/10.1116/1.5041093 · OSTI ID:1475292
 [1];  [2];  [3];  [4];  [5]; ORCiD logo [5]
  1. Virginia Polytechnic Inst. and State Univ. (Virginia Tech), Blacksburg, VA (United States)
  2. College of William and Mary, Williamsburg, VA (United States)
  3. North Carolina State Univ., Raleigh, NC (United States)
  4. College of William and Mary, Williamsburg, VA (United States); Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
  5. Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
+ Show Author Affiliations

Historically, many advances in superconducting radio frequency (SRF) cavities destined for use in advanced particle accelerators have come empirically, through the iterative procedure of modifying processing and then performance testing. However, material structure is directly responsible for performance. Understanding, the link between processing, structure, and performance will streamline and accelerate the research process. In order to connect processing, structure, and performance, accurate and robust materials characterization methods are needed. Here in this paper, one such method, SIMS, is discussed with focus on analysis of SRF materials. In addition, several examples are presented, showing how SIMS is being used to further understanding of materials based SRF technologies.

Research Organization:
Thomas Jefferson National Accelerator Facility (TJNAF), Newport News, VA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Nuclear Physics (NP)
Grant/Contract Number:
SC0014475; AC05-06OR23177
OSTI ID:
1475292
Report Number(s):
JLAB-ACC-18-2712; DOE/OR/-23177-4445
Journal Information:
Journal of Vacuum Science and Technology. B, Nanotechnology and Microelectronics, Vol. 36, Issue 5; ISSN 2166-2746
Publisher:
American Vacuum Society/AIPCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 6 works
Citation information provided by
Web of Science

Figures / Tables (15)

FIG. 1(p. 5)figure FIG. 1
FIG. 2(p. 6)figure FIG. 2
FIG. 3(p. 7)figure FIG. 3
FIG. 4(p. 8)figure FIG. 4
FIG. 5(p. 11)figure FIG. 5
FIG. 6(p. 12)figure FIG. 6
FIG. 7(p. 15)figure FIG. 7
FIG. 8(p. 16)figure FIG. 8
FIG. 9(p. 17)figure FIG. 9
FIG. 10(p. 19)figure FIG. 10
FIG. 11(p. 20)figure FIG. 11
FIG. 12(p. 22)figure FIG. 12
FIG. 13(p. 23)figure FIG. 13
FIG. 14(p. 24)figure FIG. 14
FIG. 15(p. 25)figure FIG. 15

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