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Title: Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope

Abstract

Scanning transmission electron microscopy (STEM) excels in accessing atomic-scale structure and chemistry. Enhancing our ability to directly image the functionalities of local features in materials has become one of the most important topics in the future development of STEM. Recently, differential phase contrast (DPC) imaging has been utilized to map the internal electric and magnetic fields in materials from nanoscale features such as p–n junctions, skyrmions, and even from individual atoms. Here, we use an ultra-low noise SCMOS detector in as the diffraction plane camera to collect four-dimensional (4D) datasets. The high angular resolution, efficient high-SNR acquisition, and modifiability of the camera allow it to function as a universal detector, where STEM imaging configurations, such as DPC, bright field, annular bright field, and annular dark field can all be reconstructed from a single 4D dataset. By examining a distorted perovskite, DyScO3, which possesses projected lattice spacings as small as 0.83 Å, we demonstrate DPC spatial resolution almost reaching the information limit of a 100 keV electron beam. In addition, the perovskite has ordered O-coordinations with alternating octahedral tilts, which can be quantitatively measured with single degree accuracy by taking advantage of DPC’s sensitivity to light atoms. The results, acquired onmore » a standard Ronchigram camera as opposed to a specialized DPC detector, open up new opportunities to understand and design functional materials and devices that involve lattice and charge coupling at nano- and atomic-scales.« less

Authors:
ORCiD logo [1];  [1];  [1]
  1. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1474507
Grant/Contract Number:  
AC05-00OR22725
Resource Type:
Accepted Manuscript
Journal Name:
Advanced Structural and Chemical Imaging
Additional Journal Information:
Journal Volume: 4; Journal Issue: 1; Journal ID: ISSN 2198-0926
Publisher:
Springer
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Hachtel, Jordan A., Idrobo, Juan Carlos, and Chi, Miaofang. Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope. United States: N. p., 2018. Web. doi:10.1186/s40679-018-0059-4.
Hachtel, Jordan A., Idrobo, Juan Carlos, & Chi, Miaofang. Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope. United States. doi:10.1186/s40679-018-0059-4.
Hachtel, Jordan A., Idrobo, Juan Carlos, and Chi, Miaofang. Fri . "Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope". United States. doi:10.1186/s40679-018-0059-4. https://www.osti.gov/servlets/purl/1474507.
@article{osti_1474507,
title = {Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope},
author = {Hachtel, Jordan A. and Idrobo, Juan Carlos and Chi, Miaofang},
abstractNote = {Scanning transmission electron microscopy (STEM) excels in accessing atomic-scale structure and chemistry. Enhancing our ability to directly image the functionalities of local features in materials has become one of the most important topics in the future development of STEM. Recently, differential phase contrast (DPC) imaging has been utilized to map the internal electric and magnetic fields in materials from nanoscale features such as p–n junctions, skyrmions, and even from individual atoms. Here, we use an ultra-low noise SCMOS detector in as the diffraction plane camera to collect four-dimensional (4D) datasets. The high angular resolution, efficient high-SNR acquisition, and modifiability of the camera allow it to function as a universal detector, where STEM imaging configurations, such as DPC, bright field, annular bright field, and annular dark field can all be reconstructed from a single 4D dataset. By examining a distorted perovskite, DyScO3, which possesses projected lattice spacings as small as 0.83 Å, we demonstrate DPC spatial resolution almost reaching the information limit of a 100 keV electron beam. In addition, the perovskite has ordered O-coordinations with alternating octahedral tilts, which can be quantitatively measured with single degree accuracy by taking advantage of DPC’s sensitivity to light atoms. The results, acquired on a standard Ronchigram camera as opposed to a specialized DPC detector, open up new opportunities to understand and design functional materials and devices that involve lattice and charge coupling at nano- and atomic-scales.},
doi = {10.1186/s40679-018-0059-4},
journal = {Advanced Structural and Chemical Imaging},
number = 1,
volume = 4,
place = {United States},
year = {2018},
month = {8}
}

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Works referenced in this record:

Ptychographic Imaging in an Aberration Corrected STEM
journal, August 2015

  • Lupini, Andrew R.; Chi, Miaofang; Kalinin, Sergei V.
  • Microscopy and Microanalysis, Vol. 21, Issue S3
  • DOI: 10.1017/S1431927615006881

Room-temperature ferroelectricity in strained SrTiO3
journal, August 2004

  • Haeni, J. H.; Irvin, P.; Chang, W.
  • Nature, Vol. 430, Issue 7001, p. 758-761
  • DOI: 10.1038/nature02773

Efficient phase contrast imaging in STEM using a pixelated detector. Part II: Optimisation of imaging conditions
journal, April 2015


Theory and practice of electron diffraction from single atoms and extended objects using an EMPAD
journal, December 2017


Rapid aberration measurement with pixelated detectors: RAPID ABERRATION MEASUREMENT WITH PIXELATED DETECTORS
journal, February 2016

  • Lupini, A. R.; Chi, M.; Jesse, S.
  • Journal of Microscopy, Vol. 263, Issue 1
  • DOI: 10.1111/jmi.12372

Phase retrieval and differential phase-contrast imaging with low-brilliance X-ray sources
journal, March 2006

  • Pfeiffer, Franz; Weitkamp, Timm; Bunk, Oliver
  • Nature Physics, Vol. 2, Issue 4, p. 258-261
  • DOI: 10.1038/nphys265

Direct Visualization of Local Electromagnetic Field Structures by Scanning Transmission Electron Microscopy
journal, July 2017


Imaging of built-in electric field at a p-n junction by scanning transmission electron microscopy
journal, June 2015

  • Shibata, Naoya; Findlay, Scott D.; Sasaki, Hirokazu
  • Scientific Reports, Vol. 5, Issue 1
  • DOI: 10.1038/srep10040

Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures
journal, August 2016

  • Yang, H.; Rutte, R. N.; Jones, L.
  • Nature Communications, Vol. 7, Issue 1
  • DOI: 10.1038/ncomms12532

Pixelated detectors and improved efficiency for magnetic imaging in STEM differential phase contrast
journal, June 2016


Local low rank denoising for enhanced atomic resolution imaging
journal, April 2018


Phase contrast STEM for thin samples: Integrated differential phase contrast
journal, January 2016


Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution
journal, April 2015


Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry
journal, February 2016

  • Ophus, Colin; Ciston, Jim; Pierce, Jordan
  • Nature Communications, Vol. 7, Issue 1
  • DOI: 10.1038/ncomms10719

A structural study of ternary lanthanide orthoscandate perovskites
journal, June 2004


Controlled lateral anisotropy in correlated manganite heterostructures by interface-engineered oxygen octahedral coupling
journal, March 2016

  • Liao, Z.; Huijben, M.; Zhong, Z.
  • Nature Materials, Vol. 15, Issue 4
  • DOI: 10.1038/nmat4579

High tunability of the soft mode in strained SrTiO 3 /DyScO 3 multilayers
journal, February 2009


Quantitative TEM imaging of the magnetostructural and phase transitions in FeRh thin film systems
journal, December 2017


Electric field imaging of single atoms
journal, May 2017

  • Shibata, Naoya; Seki, Takehito; Sánchez-Santolino, Gabriel
  • Nature Communications, Vol. 8, Issue 1
  • DOI: 10.1038/ncomms15631

Direct Determination of Atomic Structure and Magnetic Coupling of Magnetite Twin Boundaries
journal, February 2018


Nondestructive readout of a three-dimensional photochromic optical memory with a near-infrared differential phase-contrast microscope
journal, January 1997

  • Toriumi, A.; Herrmann, J. M.; Kawata, S.
  • Optics Letters, Vol. 22, Issue 8
  • DOI: 10.1364/OL.22.000555

Direct imaging of hydrogen-atom columns in a crystal by annular bright-field electron microscopy
journal, February 2011

  • Ishikawa, Ryo; Okunishi, Eiji; Sawada, Hidetaka
  • Nature Materials, Vol. 10, Issue 4
  • DOI: 10.1038/nmat2957

Electron ptychography of 2D materials to deep sub-ångström resolution
journal, July 2018


Differential phase-contrast microscopy at atomic resolution
journal, June 2012

  • Shibata, Naoya; Findlay, Scott D.; Kohno, Yuji
  • Nature Physics, Vol. 8, Issue 8
  • DOI: 10.1038/nphys2337

The First Analysis and Clinical Evaluation of Native Breast Tissue Using Differential Phase-Contrast Mammography
journal, January 2011


An electron microscope for the aberration-corrected era
journal, February 2008


Periodic Giant Polarization Gradients in Doped BiFeO 3 Thin Films
journal, January 2018


Direct Sub-Angstrom Imaging of a Crystal Lattice
journal, September 2004


In-situ Observation of Domain Wall Motion in Electroplated Ni80-Fe20 Thin Film by Lorentz TEM and DPC Imaging
journal, December 2017


Phase contrast scanning transmission electron microscopy imaging of light and heavy atoms at the limit of contrast and resolution
journal, February 2018


Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction
journal, December 2014

  • Müller, Knut; Krause, Florian F.; Béché, Armand
  • Nature Communications, Vol. 5, Issue 1
  • DOI: 10.1038/ncomms6653

The direct determination of magnetic domain wall profiles by differential phase contrast electron microscopy
journal, January 1978


Direct observation of Σ7 domain boundary core structure in magnetic skyrmion lattice
journal, February 2016