A Framework for Robust Long-Term Voltage Stability of Distribution Systems

Journal Article · 05 September 2018 · IEEE Transactions on Smart Grid

DOI: https://doi.org/10.1109/TSG.2018.2869032 · OSTI ID:1471070

Nguyen, Hung D. ^[1]; Dvijotham, Krishnamurthy ^[2]; Yu, Suhyoun ^[1]; Turitsyn, Konstantin ^[1]

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1. Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
2. Washington State Univ., Pullman, WA (United States); Pacific Northwest National Lab. (PNNL), Richland, WA (United States)

Power injection uncertainties in distribution power grids, which are mostly induced by aggressive introduction of intermittent renewable sources, may drive the system away from normal operating regimes and potentially lead to the loss of long-term voltage stability (LTVS). Naturally, there is an ever increasing need for a tool for assessing the LTVS of a distribution system. This paper presents a fast and reliable tool for constructing inner approximations of LTVS regions in multidimensional injection space such that every point in our constructed region is guaranteed to be solvable. Numerical simulations demonstrate that our approach outperforms all existing inner approximation methods in most cases. Furthermore, the constructed regions are shown to cover substantial fractions of the true voltage stability region. In conclusion, the paper will later discuss a number of important applications of the proposed technique, including fast screening for viable injection changes, constructing an effective solvability index and rigorously certified loadability limits.

• Research Organization: Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)
• Sponsoring Organization: USDOE
• Grant/Contract Number: AC05-76RL01830
• OSTI ID: 1471070
• Journal Information: IEEE Transactions on Smart Grid, Journal Name: IEEE Transactions on Smart Grid Journal Issue: 5 Vol. 10; ISSN 1949-3053
• Publisher: IEEECopyright Statement
• Country of Publication: United States
• Language: English