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Title: Tutorial: Defects in semiconductors—Combining experiment and theory

Journal Article · · Journal of Applied Physics
DOI: https://doi.org/10.1063/1.4948245 · OSTI ID:1471061
 [1]; ORCiD logo [2]; ORCiD logo [3]
  1. Center for Physical Sciences and Technology, Vilnius, (Lithuania)
  2. Washington State Univ., Pullman, WA (United States). Dept. of Physics and Astronomy
  3. Univ. of California, Santa Barbara, CA (United States). Materials Dept.

Point defects affect or even completely determine physical and chemical properties of semiconductors. Characterization of point defects based on experimental techniques alone is often inconclusive. In such cases, the combination of experiment and theory is crucial to gain understanding of the system studied. Here in this tutorial, we explain how and when such comparison provides new understanding of the defect physics. More specifically, we focus on processes that can be analyzed or understood in terms of configuration coordinate diagrams of defects in their different charge states. These processes include light absorption, luminescence, and nonradiative capture of charge carriers. Recent theoretical developments to describe these processes are reviewed.

Research Organization:
Univ. of California, Santa Barbara, CA (United States); Washington State Univ., Pullman, WA (United States)
Sponsoring Organization:
USDOE Office of Science (SC); USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Materials Sciences & Engineering Division
Grant/Contract Number:
SC0010689; FG02-07ER46386
OSTI ID:
1471061
Alternate ID(s):
OSTI ID: 1252795; OSTI ID: 1489137
Journal Information:
Journal of Applied Physics, Vol. 119, Issue 18; ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 273 works
Citation information provided by
Web of Science

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Figures / Tables (10)