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Title: Electronic properties of RX2Al20 (R = La, Ce, Yb, Th, U; X = Ti, V, Cr and Mn) cage compounds

Journal Article · · Computational Materials Science
 [1];  [2];  [2];  [2]
  1. Polish Academy of Sciences, Wroclaw (Poland); Ames Lab. and Iowa State Univ., Ames, IA (United States)
  2. Polish Academy of Sciences, Wroclaw (Poland)

Here, non-spin-polarized electronic structures and Fermi surface properties of RX2Al20 (R = La, Ce, Yb, Th, U; X = Ti, V, Cr, Mn) intermetallic compounds were calculated using the full potential all-electron local orbital (FPLO) approach in the framework of the local density approximation (LDA). Trends of the magnetism are discussed in terms of the characteristics of X-3d bands with a quantitative analysis of the relationship between band electron filling and crystal electric field splitting. Since coordination icosahedra of X-atoms have small trigonal distortion, crystal electric field splits the fivefold degenerate X-3d state into low-energy singlet and two higher-energy doublets eg. In RTi2Al20 and RV2Al20 the population of the related 3d sub-band is not sufficient to cause energetically favorable spin polarization, whereas magnetic instabilities develop in the RCr2Al20 series. Finally, a manifestation of strong repulsive interactions between itinerant Mn-d electrons become most pronounced in ferromagnetic UMn2Al20. The influence of non-magnetic R-f states on magnetic and thermodynamic properties is discussed with special emphasis on the role of the f–p and f–d hybridization. For LaTi2Al20 and LaV2Al20 the calculated quantum oscillation frequencies are in accord with experimental reports.

Research Organization:
Ames Laboratory (AMES), Ames, IA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
AC02-07CH11358
OSTI ID:
1471054
Alternate ID(s):
OSTI ID: 1702205
Report Number(s):
IS-J-9739; PII: S0927025618304269
Journal Information:
Computational Materials Science, Vol. 153, Issue C; ISSN 0927-0256
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 6 works
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