Effects of physical and chemical surface roughness on the brightness of electron beams from photocathodes
Abstract
The performance of free electron laser x-ray light sources, and systems for ultrafast electron diffraction and ultrafast electron microscopy, is limited by the brightness of the electron sources used. The intrinsic emittance, or equivalently, the mean transverse energy (MTE) of electrons emitted from the photocathode determines the maximum possible brightness in such systems. With ongoing improvements in photocathode design and synthesis, we are now at a point where the physical and chemical surface roughness of the cathode can become a limiting factor. Here we show how measurements of the spatially dependent variations in height and surface potential can be used to compute the electron beam mean transverse energy (MTE), one of the key determining factors in evaluation of brightness.
- Authors:
- Publication Date:
- Research Org.:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1470798
- Alternate Identifier(s):
- OSTI ID: 1478355
- Grant/Contract Number:
- KC0407-ALSJNT-I0013; AC02-05CH11231
- Resource Type:
- Published Article
- Journal Name:
- Physical Review Accelerators and Beams
- Additional Journal Information:
- Journal Name: Physical Review Accelerators and Beams Journal Volume: 21 Journal Issue: 9; Journal ID: ISSN 2469-9888
- Publisher:
- American Physical Society
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 72 PHYSICS OF ELEMENTARY PARTICLES AND FIELDS
Citation Formats
Gevorkyan, G., Karkare, S., Emamian, S., Bazarov, I. V., and Padmore, H. A. Effects of physical and chemical surface roughness on the brightness of electron beams from photocathodes. United States: N. p., 2018.
Web. doi:10.1103/PhysRevAccelBeams.21.093401.
Gevorkyan, G., Karkare, S., Emamian, S., Bazarov, I. V., & Padmore, H. A. Effects of physical and chemical surface roughness on the brightness of electron beams from photocathodes. United States. doi:10.1103/PhysRevAccelBeams.21.093401.
Gevorkyan, G., Karkare, S., Emamian, S., Bazarov, I. V., and Padmore, H. A. Fri .
"Effects of physical and chemical surface roughness on the brightness of electron beams from photocathodes". United States. doi:10.1103/PhysRevAccelBeams.21.093401.
@article{osti_1470798,
title = {Effects of physical and chemical surface roughness on the brightness of electron beams from photocathodes},
author = {Gevorkyan, G. and Karkare, S. and Emamian, S. and Bazarov, I. V. and Padmore, H. A.},
abstractNote = {The performance of free electron laser x-ray light sources, and systems for ultrafast electron diffraction and ultrafast electron microscopy, is limited by the brightness of the electron sources used. The intrinsic emittance, or equivalently, the mean transverse energy (MTE) of electrons emitted from the photocathode determines the maximum possible brightness in such systems. With ongoing improvements in photocathode design and synthesis, we are now at a point where the physical and chemical surface roughness of the cathode can become a limiting factor. Here we show how measurements of the spatially dependent variations in height and surface potential can be used to compute the electron beam mean transverse energy (MTE), one of the key determining factors in evaluation of brightness.},
doi = {10.1103/PhysRevAccelBeams.21.093401},
journal = {Physical Review Accelerators and Beams},
number = 9,
volume = 21,
place = {United States},
year = {2018},
month = {9}
}
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1103/PhysRevAccelBeams.21.093401
DOI: 10.1103/PhysRevAccelBeams.21.093401
Other availability
Search WorldCat to find libraries that may hold this journal
Cited by: 1 work
Citation information provided by
Web of Science
Web of Science
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
The transverse energy of electrons emitted from GaAs photocathodes
journal, January 1977
- Bradley, D. J.; Allenson, M. B.; Holeman, B. R.
- Journal of Physics D: Applied Physics, Vol. 10, Issue 1
Near atomically smooth alkali antimonide photocathode thin films
journal, January 2017
- Feng, Jun; Karkare, Siddharth; Nasiatka, James
- Journal of Applied Physics, Vol. 121, Issue 4
Thermal limit to the intrinsic emittance from metal photocathodes
journal, September 2015
- Feng, Jun; Nasiatka, J.; Wan, Weishi
- Applied Physics Letters, Vol. 107, Issue 13
Analytical study on emittance growth caused by roughness of a metallic photocathode
journal, May 2015
- Zhang, Zhe; Tang, Chuanxiang
- Physical Review Special Topics - Accelerators and Beams, Vol. 18, Issue 5
Advances in bright electron sources
journal, November 2018
- Musumeci, P.; Giner Navarro, J.; Rosenzweig, J. B.
- Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 907
Effects of Cathode Bumpiness on the Spatial Resolution of Proximity Focused Image Tubes
journal, January 1973
- Martinelli, Ramon U.
- Applied Optics, Vol. 12, Issue 8
Effects of Surface Nonuniformities on the Mean Transverse Energy from Photocathodes
journal, August 2015
- Karkare, Siddharth; Bazarov, Ivan
- Physical Review Applied, Vol. 4, Issue 2
First lasing and operation of an ångstrom-wavelength free-electron laser
journal, August 2010
- Emma, P.; Akre, R.; Arthur, J.
- Nature Photonics, Vol. 4, Issue 9
Ultrafast laser pulse heating of metallic photocathodes and its contribution to intrinsic emittance
journal, September 2017
- Maxson, J.; Musumeci, P.; Cultrera, L.
- Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 865
Kelvin probe force microscopy and its application
journal, January 2011
- Melitz, Wilhelm; Shen, Jian; Kummel, Andrew C.
- Surface Science Reports, Vol. 66, Issue 1
High-precision calculation of quasistatic field near a photocathode surface microrelief
journal, November 2007
- Gorlov, Timofey
- Journal of Electrostatics, Vol. 65, Issue 12
Effect of nanoscale surface roughness on transverse energy spread from GaAs photocathodes
journal, February 2011
- Karkare, Siddharth; Bazarov, Ivan
- Applied Physics Letters, Vol. 98, Issue 9
Scattering and the relationship between quantum efficiency and emittance
journal, February 2013
- Jensen, Kevin L.
- Journal of Applied Physics, Vol. 113, Issue 5
Monte Carlo charge transport and photoemission from negative electron affinity GaAs photocathodes
journal, March 2013
- Karkare, Siddharth; Dimitrov, Dimitre; Schaff, William
- Journal of Applied Physics, Vol. 113, Issue 10
Synchrotron x-ray study of a low roughness and high efficiency K 2 CsSb photocathode during film growth
journal, April 2017
- Xie, Junqi; Demarteau, Marcel; Wagner, Robert
- Journal of Physics D: Applied Physics, Vol. 50, Issue 20
Cold electron beams from cryocooled, alkali antimonide photocathodes
journal, November 2015
- Cultrera, L.; Karkare, S.; Lee, H.
- Physical Review Special Topics - Accelerators and Beams, Vol. 18, Issue 11
4d Ultrafast Electron Diffraction, Crystallography, and Microscopy
journal, May 2006
- Zewail, Ahmed H.
- Annual Review of Physical Chemistry, Vol. 57, Issue 1
Quantum efficiency and thermal emittance of metal photocathodes
journal, July 2009
- Dowell, David H.; Schmerge, John F.
- Physical Review Special Topics - Accelerators and Beams, Vol. 12, Issue 7
Emittance, surface structure, and electron emission
journal, April 2014
- Jensen, Kevin L.; Shiffler, Donald A.; Petillo, John J.
- Physical Review Special Topics - Accelerators and Beams, Vol. 17, Issue 4
A computer simulation method for the calculation of equilibrium constants for the formation of physical clusters of molecules: Application to small water clusters
journal, January 1982
- Swope, William C.; Andersen, Hans C.; Berens, Peter H.
- The Journal of Chemical Physics, Vol. 76, Issue 1
Works referencing / citing this record:
Thermal-field and photoemission from meso- and micro-scale features: Effects of screening and roughness on characterization and simulation
journal, June 2019
- Jensen, Kevin L.; McDonald, Michael; Chubenko, Oksana
- Journal of Applied Physics, Vol. 125, Issue 23