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Title: Investigation of cadmium telluride grown by molecular-beam epitaxy using micro-Raman spectroscopy below and above the laser damage threshold

Authors:
 [1];  [1];  [1];  [2]
  1. Materials Science, Engineering, and Commercialization, Texas State University, San Marcos, Texas 78666
  2. Materials Science, Engineering, and Commercialization, Texas State University, San Marcos, Texas 78666, Department of Physics, Texas State University, San Marcos, Texas 78666
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1469728
Grant/Contract Number:  
Sunshot PVRD grant DE-EE-0007541
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Journal of Vacuum Science and Technology. B, Nanotechnology and Microelectronics
Additional Journal Information:
Journal Name: Journal of Vacuum Science and Technology. B, Nanotechnology and Microelectronics Journal Volume: 36 Journal Issue: 5; Journal ID: ISSN 2166-2746
Publisher:
American Vacuum Society
Country of Publication:
United States
Language:
English

Citation Formats

Sohal, Sandeep, Edirisooriya, Madhavie, Myers, Thomas, and Holtz, Mark. Investigation of cadmium telluride grown by molecular-beam epitaxy using micro-Raman spectroscopy below and above the laser damage threshold. United States: N. p., 2018. Web. doi:10.1116/1.5048526.
Sohal, Sandeep, Edirisooriya, Madhavie, Myers, Thomas, & Holtz, Mark. Investigation of cadmium telluride grown by molecular-beam epitaxy using micro-Raman spectroscopy below and above the laser damage threshold. United States. doi:10.1116/1.5048526.
Sohal, Sandeep, Edirisooriya, Madhavie, Myers, Thomas, and Holtz, Mark. Sat . "Investigation of cadmium telluride grown by molecular-beam epitaxy using micro-Raman spectroscopy below and above the laser damage threshold". United States. doi:10.1116/1.5048526.
@article{osti_1469728,
title = {Investigation of cadmium telluride grown by molecular-beam epitaxy using micro-Raman spectroscopy below and above the laser damage threshold},
author = {Sohal, Sandeep and Edirisooriya, Madhavie and Myers, Thomas and Holtz, Mark},
abstractNote = {},
doi = {10.1116/1.5048526},
journal = {Journal of Vacuum Science and Technology. B, Nanotechnology and Microelectronics},
number = 5,
volume = 36,
place = {United States},
year = {2018},
month = {9}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1116/1.5048526

Citation Metrics:
Cited by: 1 work
Citation information provided by
Web of Science

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