Uncovering edge states and electrical inhomogeneity in MoS2 field-effect transistors
Abstract
The performances of devices based on transition metal dichalcogenides (TMDs) are far from their intrinsic limits, presumably due to various disorders in these 2D crystals. To date, little is known about the magnitude and characteristic length scale of electrical inhomogeneity induced by the disorders in TMDs. In this paper, strong mesoscopic (submicrometer) electrical inhomogeneity in MoS2 flakes, which reveals the potential fluctuations, was observed by a unique technique termed microwave impedance microscopy. The local conductance of edge states and its contribution to the transport were also resolved and analyzed experimentally for the first time, to our knowledge. Furthermore, the results provide a comprehensive understanding of the potential landscape in TMDs, which is very important for the improvement of device performance.
- Authors:
-
- Univ. of Texas, Austin, TX (United States)
- Publication Date:
- Research Org.:
- Univ. of Texas, Austin, TX (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1469663
- Grant/Contract Number:
- SC0010308
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Proceedings of the National Academy of Sciences of the United States of America
- Additional Journal Information:
- Journal Volume: 113; Journal Issue: 31; Journal ID: ISSN 0027-8424
- Publisher:
- National Academy of Sciences, Washington, DC (United States)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; MoS2; microwave impedance microscopy; edge states; electrical inhomogeneity; metal-insulator transition
Citation Formats
Wu, Di, Li, Xiao, Luan, Lan, Wu, Xiaoyu, Li, Wei, Yogeesh, Maruthi N., Ghosh, Rudresh, Chu, Zhaodong, Akinwande, Deji, Niu, Qian, and Lai, Keji. Uncovering edge states and electrical inhomogeneity in MoS2 field-effect transistors. United States: N. p., 2016.
Web. doi:10.1073/pnas.1605982113.
Wu, Di, Li, Xiao, Luan, Lan, Wu, Xiaoyu, Li, Wei, Yogeesh, Maruthi N., Ghosh, Rudresh, Chu, Zhaodong, Akinwande, Deji, Niu, Qian, & Lai, Keji. Uncovering edge states and electrical inhomogeneity in MoS2 field-effect transistors. United States. https://doi.org/10.1073/pnas.1605982113
Wu, Di, Li, Xiao, Luan, Lan, Wu, Xiaoyu, Li, Wei, Yogeesh, Maruthi N., Ghosh, Rudresh, Chu, Zhaodong, Akinwande, Deji, Niu, Qian, and Lai, Keji. Thu .
"Uncovering edge states and electrical inhomogeneity in MoS2 field-effect transistors". United States. https://doi.org/10.1073/pnas.1605982113. https://www.osti.gov/servlets/purl/1469663.
@article{osti_1469663,
title = {Uncovering edge states and electrical inhomogeneity in MoS2 field-effect transistors},
author = {Wu, Di and Li, Xiao and Luan, Lan and Wu, Xiaoyu and Li, Wei and Yogeesh, Maruthi N. and Ghosh, Rudresh and Chu, Zhaodong and Akinwande, Deji and Niu, Qian and Lai, Keji},
abstractNote = {The performances of devices based on transition metal dichalcogenides (TMDs) are far from their intrinsic limits, presumably due to various disorders in these 2D crystals. To date, little is known about the magnitude and characteristic length scale of electrical inhomogeneity induced by the disorders in TMDs. In this paper, strong mesoscopic (submicrometer) electrical inhomogeneity in MoS2 flakes, which reveals the potential fluctuations, was observed by a unique technique termed microwave impedance microscopy. The local conductance of edge states and its contribution to the transport were also resolved and analyzed experimentally for the first time, to our knowledge. Furthermore, the results provide a comprehensive understanding of the potential landscape in TMDs, which is very important for the improvement of device performance.},
doi = {10.1073/pnas.1605982113},
journal = {Proceedings of the National Academy of Sciences of the United States of America},
number = 31,
volume = 113,
place = {United States},
year = {Thu Jul 21 00:00:00 EDT 2016},
month = {Thu Jul 21 00:00:00 EDT 2016}
}
Web of Science
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