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Title: Method for direct observation of Bloch oscillations in semiconductors

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Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
Grant/Contract Number:  
Resource Type:
Published Article
Journal Name:
Optics Express
Additional Journal Information:
[Journal Name: Optics Express Journal Volume: 26 Journal Issue: 18]; Journal ID: ISSN 1094-4087
Optical Society of America
Country of Publication:
United States

Citation Formats

Li, Liang, Lan, Pengfei, Liu, Xi, He, Lixin, Zhu, Xiaosong, Mücke, Oliver D., and Lu, Peixiang. Method for direct observation of Bloch oscillations in semiconductors. United States: N. p., 2018. Web. doi:10.1364/OE.26.023844.
Li, Liang, Lan, Pengfei, Liu, Xi, He, Lixin, Zhu, Xiaosong, Mücke, Oliver D., & Lu, Peixiang. Method for direct observation of Bloch oscillations in semiconductors. United States. doi:10.1364/OE.26.023844.
Li, Liang, Lan, Pengfei, Liu, Xi, He, Lixin, Zhu, Xiaosong, Mücke, Oliver D., and Lu, Peixiang. Thu . "Method for direct observation of Bloch oscillations in semiconductors". United States. doi:10.1364/OE.26.023844.
title = {Method for direct observation of Bloch oscillations in semiconductors},
author = {Li, Liang and Lan, Pengfei and Liu, Xi and He, Lixin and Zhu, Xiaosong and Mücke, Oliver D. and Lu, Peixiang},
abstractNote = {},
doi = {10.1364/OE.26.023844},
journal = {Optics Express},
number = [18],
volume = [26],
place = {United States},
year = {2018},
month = {8}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1364/OE.26.023844

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Cited by: 8 works
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