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Title: Method for direct observation of Bloch oscillations in semiconductors

Authors:
; ; ; ; ; ORCiD logo;
Publication Date:
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1467773
Grant/Contract Number:  
[NA0003525]
Resource Type:
Published Article
Journal Name:
Optics Express
Additional Journal Information:
[Journal Name: Optics Express Journal Volume: 26 Journal Issue: 18]; Journal ID: ISSN 1094-4087
Publisher:
Optical Society of America
Country of Publication:
United States
Language:
English

Citation Formats

Li, Liang, Lan, Pengfei, Liu, Xi, He, Lixin, Zhu, Xiaosong, Mücke, Oliver D., and Lu, Peixiang. Method for direct observation of Bloch oscillations in semiconductors. United States: N. p., 2018. Web. doi:10.1364/OE.26.023844.
Li, Liang, Lan, Pengfei, Liu, Xi, He, Lixin, Zhu, Xiaosong, Mücke, Oliver D., & Lu, Peixiang. Method for direct observation of Bloch oscillations in semiconductors. United States. doi:10.1364/OE.26.023844.
Li, Liang, Lan, Pengfei, Liu, Xi, He, Lixin, Zhu, Xiaosong, Mücke, Oliver D., and Lu, Peixiang. Thu . "Method for direct observation of Bloch oscillations in semiconductors". United States. doi:10.1364/OE.26.023844.
@article{osti_1467773,
title = {Method for direct observation of Bloch oscillations in semiconductors},
author = {Li, Liang and Lan, Pengfei and Liu, Xi and He, Lixin and Zhu, Xiaosong and Mücke, Oliver D. and Lu, Peixiang},
abstractNote = {},
doi = {10.1364/OE.26.023844},
journal = {Optics Express},
number = [18],
volume = [26],
place = {United States},
year = {2018},
month = {8}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1364/OE.26.023844

Citation Metrics:
Cited by: 8 works
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