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Title: Carrier concentration and transport in Be-doped InAsSb for infrared sensing applications

Journal Article · · Proceedings of SPIE - The International Society for Optical Engineering
DOI: https://doi.org/10.1117/12.2305431 · OSTI ID:1467457
 [1];  [2];  [2];  [2];  [3];  [4];  [2];  [5]
  1. Univ. of New Mexico (United States)
  2. Air Force Research Lab. (United States)
  3. The Univ. of New Mexico (United States)
  4. Sandia National Labs. (United States)
  5. The Ohio State Univ. (United States)

Accurate p-type doping of the active region in III-V infrared detectors is essential for optimizing the detector design and overall performance. While most III-V detector absorbers are n-type (e.g., nBn), the minority carrier devices with p-type absorbers would be expected to have relatively higher quantum efficiencies due to the higher mobility of their constituent minority carrier electrons. However, correctly determining the hole carrier concentration in narrow bandgap InAsSb may be challenging due to the potential for electron accumulation at the surface of the material and at its interface with the layer grown directly below it. Electron accumulation layers form high conductance electron channels that can dominate both resistivity and Hall-effect transport measurements. Therefore, to correctly determine the bulk hole concentration and mobility, temperature- and magnetic-field-dependent transport measurements in conjunction with Multi-Carrier Fit analysis were utilized on a series of p-doped InAs0.91Sb0.09 samples on GaSb substrates. Finally, the resulting hole concentrations and mobilities at 77 K (300 K) were 1.6 x 1018 cm-3 (2.3 x 1018 cm-3) and 125 cm2 V-1 s-1 (60 cm2 V-1 s-1), respectively, compared with the intended Be-doping of ~2 x 1018 cm-3.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
Air Force Research Laboratory (AFRL); USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
AC04-94AL85000; NA0003525
OSTI ID:
1467457
Report Number(s):
SAND-2018-6645J; 664460
Journal Information:
Proceedings of SPIE - The International Society for Optical Engineering, Vol. 10624; ISSN 0277-786X
Publisher:
SPIECopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 1 work
Citation information provided by
Web of Science

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Figures / Tables (6)