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Title: Doubly triggered conductance across thin zinc oxysulfide films

 [1];  [2]; ORCiD logo [3];  [1]
  1. Department of Chemical Research Support, Weizmann Institute, Rehovot 7610001, Israel
  2. Department of Physics, Colorado School of Mines, Golden, Colorado 80214, USA
  3. Faculty of Physics, Weizmann Institute, Rehovot 7610001, Israel
Publication Date:
Sponsoring Org.:
OSTI Identifier:
Grant/Contract Number:  
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
[Journal Name: Applied Physics Letters Journal Volume: 113 Journal Issue: 9]; Journal ID: ISSN 0003-6951
American Institute of Physics
Country of Publication:
United States

Citation Formats

Givon, A., Steirer, K. X., Segre, E., and Cohen, H. Doubly triggered conductance across thin zinc oxysulfide films. United States: N. p., 2018. Web. doi:10.1063/1.5040239.
Givon, A., Steirer, K. X., Segre, E., & Cohen, H. Doubly triggered conductance across thin zinc oxysulfide films. United States. doi:10.1063/1.5040239.
Givon, A., Steirer, K. X., Segre, E., and Cohen, H. Mon . "Doubly triggered conductance across thin zinc oxysulfide films". United States. doi:10.1063/1.5040239.
title = {Doubly triggered conductance across thin zinc oxysulfide films},
author = {Givon, A. and Steirer, K. X. and Segre, E. and Cohen, H.},
abstractNote = {},
doi = {10.1063/1.5040239},
journal = {Applied Physics Letters},
number = [9],
volume = [113],
place = {United States},
year = {2018},
month = {8}

Journal Article:
Free Publicly Available Full Text
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DOI: 10.1063/1.5040239

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