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Title: Refraction-enhanced x-ray radiography for density profile measurements at CH/Be interface

Abstract

An x-ray radiographic technique utilizing refraction for phase contrast enhancement is developed. This technique is advantageous for study of discontinuities such as interfaces and shock fronts. Proof-of-principle experiment has been performed using OMEGA laser for CH/Be targets. The experimental design, including choice of backlighter, geometry and tolerance of surface roughness, is presented. Finally, factors affecting the spatial resolution, background and sensitivity are discussed.

Authors:
 [1];  [1];  [1];  [1];  [1];  [1];  [1];  [1]
  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Publication Date:
Research Org.:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1466907
Report Number(s):
LLNL-JRNL-485273
Journal ID: ISSN 1748-0221; 494338
Grant/Contract Number:  
AC52-07NA27344
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Instrumentation
Additional Journal Information:
Journal Volume: 6; Journal Issue: 09; Journal ID: ISSN 1748-0221
Publisher:
Institute of Physics (IOP)
Country of Publication:
United States
Language:
English
Subject:
70 PLASMA PHYSICS AND FUSION TECHNOLOGY; Plasma diagnostics - interferometry; spectroscopy and imaging; X-ray radiography and digital radiography (DR)

Citation Formats

Ping, Y., Landen, O. L., Hicks, D. G., Koch, J. A., Wallace, R., Sorce, C., Hammel, B. A., and Collins, G. W. Refraction-enhanced x-ray radiography for density profile measurements at CH/Be interface. United States: N. p., 2011. Web. doi:10.1088/1748-0221/6/09/P09004.
Ping, Y., Landen, O. L., Hicks, D. G., Koch, J. A., Wallace, R., Sorce, C., Hammel, B. A., & Collins, G. W. Refraction-enhanced x-ray radiography for density profile measurements at CH/Be interface. United States. doi:10.1088/1748-0221/6/09/P09004.
Ping, Y., Landen, O. L., Hicks, D. G., Koch, J. A., Wallace, R., Sorce, C., Hammel, B. A., and Collins, G. W. Tue . "Refraction-enhanced x-ray radiography for density profile measurements at CH/Be interface". United States. doi:10.1088/1748-0221/6/09/P09004. https://www.osti.gov/servlets/purl/1466907.
@article{osti_1466907,
title = {Refraction-enhanced x-ray radiography for density profile measurements at CH/Be interface},
author = {Ping, Y. and Landen, O. L. and Hicks, D. G. and Koch, J. A. and Wallace, R. and Sorce, C. and Hammel, B. A. and Collins, G. W.},
abstractNote = {An x-ray radiographic technique utilizing refraction for phase contrast enhancement is developed. This technique is advantageous for study of discontinuities such as interfaces and shock fronts. Proof-of-principle experiment has been performed using OMEGA laser for CH/Be targets. The experimental design, including choice of backlighter, geometry and tolerance of surface roughness, is presented. Finally, factors affecting the spatial resolution, background and sensitivity are discussed.},
doi = {10.1088/1748-0221/6/09/P09004},
journal = {Journal of Instrumentation},
number = 09,
volume = 6,
place = {United States},
year = {2011},
month = {9}
}

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Cited by: 9 works
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