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Title: An improved method for determining carrier densities via drive level capacitance profiling

Abstract

In this paper, we demonstrate that an analytic relationship between coefficients in the Taylor expansion of the junction capacitance can be exploited to yield more precise determinations of carrier densities in drive level capacitance profiling (DLCP). Improvements are demonstrated on data generated according to the DLCP theory and in measurements performed on a CuIn xGa 1–xSe 2 device. We argue that the improved DLCP method is especially important for non-uniform devices, which are more susceptible to noise in the capacitance data used in DLCP because they require that the amplitude of the drive level be restricted. Importantly, the analysis does not require the collection of any data other than what is typically collected during a DLCP measurement while employing fewer independent parameters than the model that is typically used in DLCP. Finally and thus, we expect that it will be readily adoptable by those who perform DLCP measurements.

Authors:
ORCiD logo [1];  [1]; ORCiD logo [1]; ORCiD logo [2]; ORCiD logo [3]
  1. Univ. of Oregon, Eugene, OR (United States). Dept. of Physics
  2. Univ. of Delaware, Newark, DE (United States). Inst. of Energy Conversion
  3. Univ. of Oregon, Eugene, OR (United States). Dept. of Chemistry and Biochemistry
Publication Date:
Research Org.:
Univ. of Oregon, Eugene, OR (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
OSTI Identifier:
1466216
Alternate Identifier(s):
OSTI ID: 1361892
Grant/Contract Number:  
EE0004946
Resource Type:
Accepted Manuscript
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 110; Journal Issue: 20; Journal ID: ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
30 DIRECT ENERGY CONVERSION; capacitance; collective models; data sets; solar cells; carrier density; polynomials; machinery noise; data analysis; computer modeling

Citation Formats

Warren, Charles W., Roe, Ellis T., Miller, D. Westley, Shafarman, William N., and Lonergan, Mark C. An improved method for determining carrier densities via drive level capacitance profiling. United States: N. p., 2017. Web. doi:10.1063/1.4983367.
Warren, Charles W., Roe, Ellis T., Miller, D. Westley, Shafarman, William N., & Lonergan, Mark C. An improved method for determining carrier densities via drive level capacitance profiling. United States. doi:10.1063/1.4983367.
Warren, Charles W., Roe, Ellis T., Miller, D. Westley, Shafarman, William N., and Lonergan, Mark C. Mon . "An improved method for determining carrier densities via drive level capacitance profiling". United States. doi:10.1063/1.4983367. https://www.osti.gov/servlets/purl/1466216.
@article{osti_1466216,
title = {An improved method for determining carrier densities via drive level capacitance profiling},
author = {Warren, Charles W. and Roe, Ellis T. and Miller, D. Westley and Shafarman, William N. and Lonergan, Mark C.},
abstractNote = {In this paper, we demonstrate that an analytic relationship between coefficients in the Taylor expansion of the junction capacitance can be exploited to yield more precise determinations of carrier densities in drive level capacitance profiling (DLCP). Improvements are demonstrated on data generated according to the DLCP theory and in measurements performed on a CuInxGa1–xSe2 device. We argue that the improved DLCP method is especially important for non-uniform devices, which are more susceptible to noise in the capacitance data used in DLCP because they require that the amplitude of the drive level be restricted. Importantly, the analysis does not require the collection of any data other than what is typically collected during a DLCP measurement while employing fewer independent parameters than the model that is typically used in DLCP. Finally and thus, we expect that it will be readily adoptable by those who perform DLCP measurements.},
doi = {10.1063/1.4983367},
journal = {Applied Physics Letters},
number = 20,
volume = 110,
place = {United States},
year = {2017},
month = {5}
}

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