In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X
- Authors:
-
- Auburn University, Auburn, Alabama 36849-5412, USA
- Princeton Plasma Physics Laboratory, Princeton, New Jersey 08540, USA
- Max-Planck-Institut für Plasmaphysik, Greifswald, Germany
- Plasma Science Fusion Center, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1466080
- Grant/Contract Number:
- AC02-09CH11466
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Review of Scientific Instruments
- Additional Journal Information:
- Journal Name: Review of Scientific Instruments Journal Volume: 89 Journal Issue: 10; Journal ID: ISSN 0034-6748
- Publisher:
- American Institute of Physics
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Kring, J., Pablant, N., Langenberg, A., Rice, J., Delgado-Aparicio, L., Maurer, D., Traverso, P., Bitter, M., Hill, K., and Reinke, M. In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X. United States: N. p., 2018.
Web. doi:10.1063/1.5038809.
Kring, J., Pablant, N., Langenberg, A., Rice, J., Delgado-Aparicio, L., Maurer, D., Traverso, P., Bitter, M., Hill, K., & Reinke, M. In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X. United States. https://doi.org/10.1063/1.5038809
Kring, J., Pablant, N., Langenberg, A., Rice, J., Delgado-Aparicio, L., Maurer, D., Traverso, P., Bitter, M., Hill, K., and Reinke, M. Mon .
"In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X". United States. https://doi.org/10.1063/1.5038809.
@article{osti_1466080,
title = {In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X},
author = {Kring, J. and Pablant, N. and Langenberg, A. and Rice, J. and Delgado-Aparicio, L. and Maurer, D. and Traverso, P. and Bitter, M. and Hill, K. and Reinke, M.},
abstractNote = {},
doi = {10.1063/1.5038809},
journal = {Review of Scientific Instruments},
number = 10,
volume = 89,
place = {United States},
year = {Mon Oct 01 00:00:00 EDT 2018},
month = {Mon Oct 01 00:00:00 EDT 2018}
}
Free Publicly Available Full Text
Publisher's Version of Record
https://doi.org/10.1063/1.5038809
https://doi.org/10.1063/1.5038809
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Cited by: 7 works
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Works referenced in this record:
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