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Title: In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X

Authors:
 [1]; ORCiD logo [2]; ORCiD logo [3];  [4];  [2]; ORCiD logo [1];  [1];  [2];  [2]; ORCiD logo [2]
  1. Auburn University, Auburn, Alabama 36849-5412, USA
  2. Princeton Plasma Physics Laboratory, Princeton, New Jersey 08540, USA
  3. Max-Planck-Institut für Plasmaphysik, Greifswald, Germany
  4. Plasma Science Fusion Center, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
Publication Date:
Sponsoring Org.:
USDOE
OSTI Identifier:
1466080
Grant/Contract Number:  
AC02-09CH11466
Resource Type:
Publisher's Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Name: Review of Scientific Instruments Journal Volume: 89 Journal Issue: 10; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics
Country of Publication:
United States
Language:
English

Citation Formats

Kring, J., Pablant, N., Langenberg, A., Rice, J., Delgado-Aparicio, L., Maurer, D., Traverso, P., Bitter, M., Hill, K., and Reinke, M. In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X. United States: N. p., 2018. Web. doi:10.1063/1.5038809.
Kring, J., Pablant, N., Langenberg, A., Rice, J., Delgado-Aparicio, L., Maurer, D., Traverso, P., Bitter, M., Hill, K., & Reinke, M. In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X. United States. doi:10.1063/1.5038809.
Kring, J., Pablant, N., Langenberg, A., Rice, J., Delgado-Aparicio, L., Maurer, D., Traverso, P., Bitter, M., Hill, K., and Reinke, M. Mon . "In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X". United States. doi:10.1063/1.5038809.
@article{osti_1466080,
title = {In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X},
author = {Kring, J. and Pablant, N. and Langenberg, A. and Rice, J. and Delgado-Aparicio, L. and Maurer, D. and Traverso, P. and Bitter, M. and Hill, K. and Reinke, M.},
abstractNote = {},
doi = {10.1063/1.5038809},
journal = {Review of Scientific Instruments},
number = 10,
volume = 89,
place = {United States},
year = {2018},
month = {10}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record
DOI: 10.1063/1.5038809

Citation Metrics:
Cited by: 2 works
Citation information provided by
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Works referenced in this record:

Multi-energy x-ray detector calibration for Te and impurity density (nZ) measurements of MCF plasmas
journal, August 2016

  • Maddox, J.; Pablant, N.; Efthimion, P.
  • Review of Scientific Instruments, Vol. 87, Issue 11
  • DOI: 10.1063/1.4960602

Measurement of helium-like and hydrogen-like argon spectra using double-crystal X-ray spectrometers on EAST
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