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This content will become publicly available on August 23, 2019

Title: In situ wavelength calibration system for the X-ray Imaging Crystal Spectrometer (XICS) on W7-X

Authors:
 [1] ; ORCiD logo [2] ; ORCiD logo [3] ;  [4] ;  [2] ; ORCiD logo [1] ;  [1] ;  [2] ;  [2] ; ORCiD logo [2]
  1. Auburn University, Auburn, Alabama 36849-5412, USA
  2. Princeton Plasma Physics Laboratory, Princeton, New Jersey 08540, USA
  3. Max-Planck-Institut für Plasmaphysik, Greifswald, Germany
  4. Plasma Science Fusion Center, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
Publication Date:
Grant/Contract Number:
AC02-09CH11466
Type:
Publisher's Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Name: Review of Scientific Instruments Journal Volume: 89 Journal Issue: 10; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1466080