Growth, structural, and magnetic properties of single-crystal full-Heusler Co2TiGe thin films
Abstract
This paper presents the growth, structural characterization, and measurement of magnetic properties of Co2TiGe thin films grown by molecular beam epitaxy on insulating MgO (001) substrates and conductive lattice matched InAlAs/InGaAs/InAlAs epitaxial layers grown on n-InP (001) substrates. A GdAs diffusion barrier was used to minimize interfacial reactions during Co2TiGe growth on InAlAs. The surface morphology, structural quality, and magnetic behavior were examined by reflection high-energy electron diffraction, scanning tunneling microscopy, X-ray diffraction, and superconducting quantum interference device magnetometry. The results reveal high quality Co2TiGe thin films with a saturation magnetization of ~1.8 μB/formula unit and a Curie temperature of ~375 K. Finally, the magnetic easy axis was found to lie in the [110] direction but magnetometry also reveals that there is only a small difference in energy between the [110] and [010] magnetization directions.
- Authors:
-
[1];
[1];
[1];
[2];
- Univ. of California, Santa Barbara, CA (United States). Materials Dept.
- Univ. of California, Santa Barbara, CA (United States). Dept. of Electrical and Computer Engineering
- Univ. of California, Santa Barbara, CA (United States). Materials Dept. Dept. of Electrical and Computer Engineering
- Publication Date:
- Research Org.:
- Univ. of California, Santa Barbara, CA (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES); National Science Foundation (NSF)
- OSTI Identifier:
- 1465336
- Alternate Identifier(s):
- OSTI ID: 1366557
- Grant/Contract Number:
- SC0014388; DMR 11–21053
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Journal of Applied Physics
- Additional Journal Information:
- Journal Volume: 121; Journal Issue: 21; Journal ID: ISSN 0021-8979
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; scanning tunneling microscopy; thin film growth; carbon dioxide; crystal structure; reflection high energy electron diffraction; superconducting quantum interference devices; magnetic films; epitaxy
Citation Formats
Logan, J. A., Brown-Heft, T. L., Harrington, S. D., Wilson, N. S., McFadden, A. P., Rice, A. D., Pendharkar, M., and Palmstrøm, C. J. Growth, structural, and magnetic properties of single-crystal full-Heusler Co2TiGe thin films. United States: N. p., 2017.
Web. doi:10.1063/1.4984311.
Logan, J. A., Brown-Heft, T. L., Harrington, S. D., Wilson, N. S., McFadden, A. P., Rice, A. D., Pendharkar, M., & Palmstrøm, C. J. Growth, structural, and magnetic properties of single-crystal full-Heusler Co2TiGe thin films. United States. https://doi.org/10.1063/1.4984311
Logan, J. A., Brown-Heft, T. L., Harrington, S. D., Wilson, N. S., McFadden, A. P., Rice, A. D., Pendharkar, M., and Palmstrøm, C. J. Mon .
"Growth, structural, and magnetic properties of single-crystal full-Heusler Co2TiGe thin films". United States. https://doi.org/10.1063/1.4984311. https://www.osti.gov/servlets/purl/1465336.
@article{osti_1465336,
title = {Growth, structural, and magnetic properties of single-crystal full-Heusler Co2TiGe thin films},
author = {Logan, J. A. and Brown-Heft, T. L. and Harrington, S. D. and Wilson, N. S. and McFadden, A. P. and Rice, A. D. and Pendharkar, M. and Palmstrøm, C. J.},
abstractNote = {This paper presents the growth, structural characterization, and measurement of magnetic properties of Co2TiGe thin films grown by molecular beam epitaxy on insulating MgO (001) substrates and conductive lattice matched InAlAs/InGaAs/InAlAs epitaxial layers grown on n-InP (001) substrates. A GdAs diffusion barrier was used to minimize interfacial reactions during Co2TiGe growth on InAlAs. The surface morphology, structural quality, and magnetic behavior were examined by reflection high-energy electron diffraction, scanning tunneling microscopy, X-ray diffraction, and superconducting quantum interference device magnetometry. The results reveal high quality Co2TiGe thin films with a saturation magnetization of ~1.8 μB/formula unit and a Curie temperature of ~375 K. Finally, the magnetic easy axis was found to lie in the [110] direction but magnetometry also reveals that there is only a small difference in energy between the [110] and [010] magnetization directions.},
doi = {10.1063/1.4984311},
journal = {Journal of Applied Physics},
number = 21,
volume = 121,
place = {United States},
year = {2017},
month = {6}
}
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