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Title: Growth, structural, and magnetic properties of single-crystal full-Heusler Co 2TiGe thin films

This paper presents the growth, structural characterization, and measurement of magnetic properties of Co 2TiGe thin films grown by molecular beam epitaxy on insulating MgO (001) substrates and conductive lattice matched InAlAs/InGaAs/InAlAs epitaxial layers grown on n-InP (001) substrates. A GdAs diffusion barrier was used to minimize interfacial reactions during Co 2TiGe growth on InAlAs. The surface morphology, structural quality, and magnetic behavior were examined by reflection high-energy electron diffraction, scanning tunneling microscopy, X-ray diffraction, and superconducting quantum interference device magnetometry. The results reveal high quality Co 2TiGe thin films with a saturation magnetization of ~1.8 μ B/formula unit and a Curie temperature of ~375 K. Finally, the magnetic easy axis was found to lie in the [110] direction but magnetometry also reveals that there is only a small difference in energy between the [110] and [010] magnetization directions.
Authors:
ORCiD logo [1] ;  [1] ; ORCiD logo [1] ;  [1] ;  [2] ; ORCiD logo [1] ; ORCiD logo [2] ;  [3]
  1. Univ. of California, Santa Barbara, CA (United States). Materials Dept.
  2. Univ. of California, Santa Barbara, CA (United States). Dept. of Electrical and Computer Engineering
  3. Univ. of California, Santa Barbara, CA (United States). Materials Dept. Dept. of Electrical and Computer Engineering
Publication Date:
Grant/Contract Number:
SC0014388; DMR 11–21053
Type:
Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 121; Journal Issue: 21; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics (AIP)
Research Org:
Univ. of California, Santa Barbara, CA (United States)
Sponsoring Org:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22); National Science Foundation (NSF)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; scanning tunneling microscopy; thin film growth; carbon dioxide; crystal structure; reflection high energy electron diffraction; superconducting quantum interference devices; magnetic films; epitaxy
OSTI Identifier:
1465336
Alternate Identifier(s):
OSTI ID: 1366557

Logan, J. A., Brown-Heft, T. L., Harrington, S. D., Wilson, N. S., McFadden, A. P., Rice, A. D., Pendharkar, M., and Palmstrøm, C. J.. Growth, structural, and magnetic properties of single-crystal full-Heusler Co2TiGe thin films. United States: N. p., Web. doi:10.1063/1.4984311.
Logan, J. A., Brown-Heft, T. L., Harrington, S. D., Wilson, N. S., McFadden, A. P., Rice, A. D., Pendharkar, M., & Palmstrøm, C. J.. Growth, structural, and magnetic properties of single-crystal full-Heusler Co2TiGe thin films. United States. doi:10.1063/1.4984311.
Logan, J. A., Brown-Heft, T. L., Harrington, S. D., Wilson, N. S., McFadden, A. P., Rice, A. D., Pendharkar, M., and Palmstrøm, C. J.. 2017. "Growth, structural, and magnetic properties of single-crystal full-Heusler Co2TiGe thin films". United States. doi:10.1063/1.4984311. https://www.osti.gov/servlets/purl/1465336.
@article{osti_1465336,
title = {Growth, structural, and magnetic properties of single-crystal full-Heusler Co2TiGe thin films},
author = {Logan, J. A. and Brown-Heft, T. L. and Harrington, S. D. and Wilson, N. S. and McFadden, A. P. and Rice, A. D. and Pendharkar, M. and Palmstrøm, C. J.},
abstractNote = {This paper presents the growth, structural characterization, and measurement of magnetic properties of Co2TiGe thin films grown by molecular beam epitaxy on insulating MgO (001) substrates and conductive lattice matched InAlAs/InGaAs/InAlAs epitaxial layers grown on n-InP (001) substrates. A GdAs diffusion barrier was used to minimize interfacial reactions during Co2TiGe growth on InAlAs. The surface morphology, structural quality, and magnetic behavior were examined by reflection high-energy electron diffraction, scanning tunneling microscopy, X-ray diffraction, and superconducting quantum interference device magnetometry. The results reveal high quality Co2TiGe thin films with a saturation magnetization of ~1.8 μB/formula unit and a Curie temperature of ~375 K. Finally, the magnetic easy axis was found to lie in the [110] direction but magnetometry also reveals that there is only a small difference in energy between the [110] and [010] magnetization directions.},
doi = {10.1063/1.4984311},
journal = {Journal of Applied Physics},
number = 21,
volume = 121,
place = {United States},
year = {2017},
month = {6}
}