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Title: Thermal Stability of Hole-Selective Tungsten Oxide: In Situ Transmission Electron Microscopy Study

Authors:
; ; ORCiD logo ; ORCiD logo ; ; ; ORCiD logo
Publication Date:
Grant/Contract Number:
EE0007533; AC02- 05CH11231
Type:
Published Article
Journal Name:
Scientific Reports
Additional Journal Information:
Journal Name: Scientific Reports Journal Volume: 8 Journal Issue: 1; Journal ID: ISSN 2045-2322
Publisher:
Nature Publishing Group
Sponsoring Org:
USDOE
Country of Publication:
United Kingdom
Language:
English
OSTI Identifier:
1464976

Ali, Haider, Koul, Supriya, Gregory, Geoffrey, Bullock, James, Javey, Ali, Kushima, Akihiro, and Davis, Kristopher O. Thermal Stability of Hole-Selective Tungsten Oxide: In Situ Transmission Electron Microscopy Study. United Kingdom: N. p., Web. doi:10.1038/s41598-018-31053-w.
Ali, Haider, Koul, Supriya, Gregory, Geoffrey, Bullock, James, Javey, Ali, Kushima, Akihiro, & Davis, Kristopher O. Thermal Stability of Hole-Selective Tungsten Oxide: In Situ Transmission Electron Microscopy Study. United Kingdom. doi:10.1038/s41598-018-31053-w.
Ali, Haider, Koul, Supriya, Gregory, Geoffrey, Bullock, James, Javey, Ali, Kushima, Akihiro, and Davis, Kristopher O. 2018. "Thermal Stability of Hole-Selective Tungsten Oxide: In Situ Transmission Electron Microscopy Study". United Kingdom. doi:10.1038/s41598-018-31053-w.
@article{osti_1464976,
title = {Thermal Stability of Hole-Selective Tungsten Oxide: In Situ Transmission Electron Microscopy Study},
author = {Ali, Haider and Koul, Supriya and Gregory, Geoffrey and Bullock, James and Javey, Ali and Kushima, Akihiro and Davis, Kristopher O.},
abstractNote = {},
doi = {10.1038/s41598-018-31053-w},
journal = {Scientific Reports},
number = 1,
volume = 8,
place = {United Kingdom},
year = {2018},
month = {8}
}

Works referenced in this record:

Surface passivation of crystalline silicon solar cells: a review
journal, January 2000