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Title: Note: Narrow x-ray reflections are easier to locate with sandpaper

Abstract

Here, synchrotrons can provide almost perfectly unidirectional and monochromatic x-rays. Such x-rays reflect from ideal crystals only over a minute part of the angular range that must be searched for the reflection. Spoiling the incoming x-rays' directionality with sandpaper makes it easier to find the reflection.

Authors:
ORCiD logo [1];  [2]
  1. Ecopulse, Inc., Springfield, VA (United States)
  2. Argonne National Lab. (ANL), Argonne, IL (United States)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division
OSTI Identifier:
1464634
Alternate Identifier(s):
OSTI ID: 1420019
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 89; Journal Issue: 2; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Pereira, N. R., and Macrander, A. T.. Note: Narrow x-ray reflections are easier to locate with sandpaper. United States: N. p., 2018. Web. https://doi.org/10.1063/1.5019463.
Pereira, N. R., & Macrander, A. T.. Note: Narrow x-ray reflections are easier to locate with sandpaper. United States. https://doi.org/10.1063/1.5019463
Pereira, N. R., and Macrander, A. T.. Fri . "Note: Narrow x-ray reflections are easier to locate with sandpaper". United States. https://doi.org/10.1063/1.5019463. https://www.osti.gov/servlets/purl/1464634.
@article{osti_1464634,
title = {Note: Narrow x-ray reflections are easier to locate with sandpaper},
author = {Pereira, N. R. and Macrander, A. T.},
abstractNote = {Here, synchrotrons can provide almost perfectly unidirectional and monochromatic x-rays. Such x-rays reflect from ideal crystals only over a minute part of the angular range that must be searched for the reflection. Spoiling the incoming x-rays' directionality with sandpaper makes it easier to find the reflection.},
doi = {10.1063/1.5019463},
journal = {Review of Scientific Instruments},
number = 2,
volume = 89,
place = {United States},
year = {2018},
month = {2}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

Figures / Tables:

FIG. 1. FIG. 1. : The reflection of highly unidirectional and monochromatic 10 keV x-rays from (50$\overline{5}$2) quartz, over ≃ 400 $µ$rad of a 1000- step long search. Black dashed line without sandpaper, red solid line with x-rays passed through sandpaper. The blue bar in the middle is the estimated Darwin width.

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Works referenced in this record:

Analysis and implementation of a space resolving spherical crystal spectrometer for x-ray Thomson scattering experiments
journal, April 2015

  • Harding, E. C.; Ao, T.; Bailey, J. E.
  • Review of Scientific Instruments, Vol. 86, Issue 4
  • DOI: 10.1063/1.4918619

Spherical quartz crystals investigated with synchrotron radiation
journal, October 2015

  • Pereira, N. R.; Macrander, A. T.; Hill, K. W.
  • Review of Scientific Instruments, Vol. 86, Issue 10
  • DOI: 10.1063/1.4934197

Advanced in situ metrology for x-ray beam shaping with super precision
journal, January 2015

  • Wang, Hongchang; Sutter, John; Sawhney, Kawal
  • Optics Express, Vol. 23, Issue 2
  • DOI: 10.1364/oe.23.001605

Spherical analyzers and monochromators for resonant inelastic hard X-ray scattering: a compilation of crystals and reflections
journal, November 2012

  • Gog, Thomas; Casa, Diego M.; Said, Ayman H.
  • Journal of Synchrotron Radiation, Vol. 20, Issue 1
  • DOI: 10.1107/s0909049512043154

Characterization of spatially resolved high resolution x-ray spectrometers for high energy density physics and light source experiments
journal, November 2014

  • Hill, K. W.; Bitter, M.; Delgado-Aparacio, L.
  • Review of Scientific Instruments, Vol. 85, Issue 11
  • DOI: 10.1063/1.4890260

    Figures / Tables found in this record:

      Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.