Green’s function for a sharpened and metal-coated dielectric probe

Khullar, Vineet K.; Gu, Gong; Passian, Ali; Ferrell, Thomas L.

doi:10.1364/AO.57.002150

Title: Green’s function for a sharpened and metal-coated dielectric probe

Journal Article · 15 March 2018 · Applied Optics

DOI: https://doi.org/10.1364/AO.57.002150 · OSTI ID:1464005

Khullar, Vineet K. ^[1]; Gu, Gong ^[2];

^[1]; Ferrell, Thomas L. ^[2]

Univ. of Tennessee, Knoxville, TN (United States); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Univ. of Tennessee, Knoxville, TN (United States)

In apertureless scanning-probe optical microscopy and in the case of more traditional scanned optical probes coated with a metal that is thin near the probe tip (in lieu of an aperture), samples are probed via interaction between the probe and surface. In the nanometer-scale region between the tip and the sample, the field can be approximated by quasi-electrostatic analytics. Hence, the coated probe can be modeled as in the present case as a hyperboloid of revolution without the need for hyperboloidal wave functions in the near zone. The solutions to Laplace’s equation and in general Green’s function with the application of the boundary conditions, therefore, yield an appropriate approximation and allow a completely analytical solution for the resonance effects upon the probe tip to be obtained. In conclusion, the large field enhancements due to the sharpness of the tip and to surface plasmon fields may thus be analytically examined.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1464005

Alternate ID(s):: OSTI ID: 1425721

Journal Information:: Applied Optics, Vol. 57, Issue 9; ISSN 1559-128X

Publisher:: Optical Society of AmericaCopyright Statement

Country of Publication:: United States

Language:: English

References (10)

Apertureless near‐field optical microscope Zenhausern, F.; O’Boyle, M. P.; Wickramasinghe, H. K. Applied Physics Letters, Vol. 65, Issue 13 https://doi.org/10.1063/1.112931	journal	September 1994
Plasma Losses by Fast Electrons in Thin Films Ritchie, R. H. Physical Review, Vol. 106, Issue 5 https://doi.org/10.1103/PhysRev.106.874	journal	June 1957
Near-field scanning optical microscope with a metallic probe tip Inouye, Yasushi; Kawata, Satoshi Optics Letters, Vol. 19, Issue 3 https://doi.org/10.1364/OL.19.000159	journal	January 1994
Surface-enhanced optical microscopy Wessel, John Journal of the Optical Society of America B, Vol. 2, Issue 9 https://doi.org/10.1364/JOSAB.2.001538	journal	January 1985
Near-field optical microscope based on local perturbation of a diffraction spot Bachelot, R.; Gleyzes, P.; Boccara, A. C. Optics Letters, Vol. 20, Issue 18 https://doi.org/10.1364/OL.20.001924	journal	January 1995
Photon scanning tunneling microscopy Reddick, R. C.; Warmack, R. J.; Chilcott, D. W. Review of Scientific Instruments, Vol. 61, Issue 12, p. 3669-3677 https://doi.org/10.1063/1.1141534	journal	December 1990
XXXVIII. A suggested method for extending microscopic resolution into the ultra-microscopic region Synge, E. H. The London, Edinburgh, and Dublin Philosophical Magazine and Journal of Science, Vol. 6, Issue 35 https://doi.org/10.1080/14786440808564615	journal	August 1928
Strength of the electric field in apertureless near-field optical microscopy Martin, Yves C.; Hamann, Hendrik F.; Wickramasinghe, H. Kumar Journal of Applied Physics, Vol. 89, Issue 10 https://doi.org/10.1063/1.1354655	journal	May 2001
Optical stethoscopy: Image recording with resolution λ/20 Pohl, D. W.; Denk, W.; Lanz, M. Applied Physics Letters, Vol. 44, Issue 7 https://doi.org/10.1063/1.94865	journal	April 1984
Progress in photon scanning tunneling microscopy (PSTM) Ferrell, T. L.; Sharp, S. L.; Warmack, R. J. Ultramicroscopy, Vol. 42-44 https://doi.org/10.1016/0304-3991(92)90300-9	journal	July 1992