Analysis of Back-Contact Interface Recombination in Thin-Film Solar Cells
[1];
[3];
[6]
- Texas State Univ., San Marcos, TX (United States)
- First Solar, Inc., Perrysburg, OH (United States)
- National Renewable Energy Lab. (NREL), Golden, CO (United States)
- Ascent Solar Technologies, Inc., Thornton, CO (United States)
- Stion Corp., San Jose, CA (United States)
- National Cheng Kung Univ., Tainan City (Taiwan)
The open-circuit voltage (VOC) in a generic TCO/buffer/absorber/back-contact thin-film solar cell device is a key parameter in the recombination analysis. In particular, VOC is sensitively influenced by the interface recombination at the buffer/absorber front interface and at the absorber/back-contact interface. This paper reports the temperature, excitation light intensity, and wavelength-dependent open-circuit voltage analysis to separate and quantify recombination rates in solar cells at the front and back interfaces, in the depletion regions, and in the quasi-neutral region. The wavelength-dependent VOC analysis is exploited to extract the absorber/back-contact recombination coefficient. The experimentally observed results are verified using SCAPS-1D (one dimensional-a solar cell capacitance simulator) simulation.
- Research Organization:
- National Renewable Energy Laboratory (NREL), Golden, CO (United States)
- Sponsoring Organization:
- USDOE Office of Energy Efficiency and Renewable Energy (EERE)
- Grant/Contract Number:
- AC36-08GO28308
- OSTI ID:
- 1462336
- Report Number(s):
- NREL/JA-5K00-72052
- Journal Information:
- IEEE Journal of Photovoltaics, Vol. 8, Issue 3; ISSN 2156-3381
- Publisher:
- IEEECopyright Statement
- Country of Publication:
- United States
- Language:
- English
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