skip to main content
DOE PAGES title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Abstract

In this paper, we describe a detailed procedure for acquiring and processing x-ray microfluorescence (μXRF), and Laue and powder microdiffraction two-dimensional (2D) maps at beamline 12.3.2 of the Advanced Light Source (ALS), Lawrence Berkeley National Laboratory. Measurements can be performed on any sample that is less than 10 cm x 10 cm x 5 cm, with a flat exposed surface. The experimental geometry is calibrated using standard materials (elemental standards for XRF, and crystalline samples such as Si, quartz, or Al 2O 3 for diffraction). Samples are aligned to the focal point of the x-ray microbeam, and raster scans are performed, where each pixel of a map corresponds to one measurement, e.g., one XRF spectrum or one diffraction pattern. The data are then processed using the in-house developed software XMAS, which outputs text files, where each row corresponds to a pixel position. Representative data from moissanite and an olive snail shell are presented to demonstrate data quality, collection, and analysis strategies.

Authors:
 [1];  [1]
  1. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Publication Date:
Research Org.:
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22). Scientific User Facilities Division
OSTI Identifier:
1462004
Grant/Contract Number:  
AC02-05CH11231
Resource Type:
Accepted Manuscript
Journal Name:
Journal of Visualized Experiments
Additional Journal Information:
Journal Volume: 2018; Journal Issue: 136; Journal ID: ISSN 1940-087X
Publisher:
MyJoVE Corp.
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE

Citation Formats

Stan, Camelia V., and Tamura, Nobumichi. Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples. United States: N. p., 2018. Web. doi:10.3791/57874.
Stan, Camelia V., & Tamura, Nobumichi. Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples. United States. doi:10.3791/57874.
Stan, Camelia V., and Tamura, Nobumichi. Wed . "Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples". United States. doi:10.3791/57874. https://www.osti.gov/servlets/purl/1462004.
@article{osti_1462004,
title = {Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples},
author = {Stan, Camelia V. and Tamura, Nobumichi},
abstractNote = {In this paper, we describe a detailed procedure for acquiring and processing x-ray microfluorescence (μXRF), and Laue and powder microdiffraction two-dimensional (2D) maps at beamline 12.3.2 of the Advanced Light Source (ALS), Lawrence Berkeley National Laboratory. Measurements can be performed on any sample that is less than 10 cm x 10 cm x 5 cm, with a flat exposed surface. The experimental geometry is calibrated using standard materials (elemental standards for XRF, and crystalline samples such as Si, quartz, or Al2O3 for diffraction). Samples are aligned to the focal point of the x-ray microbeam, and raster scans are performed, where each pixel of a map corresponds to one measurement, e.g., one XRF spectrum or one diffraction pattern. The data are then processed using the in-house developed software XMAS, which outputs text files, where each row corresponds to a pixel position. Representative data from moissanite and an olive snail shell are presented to demonstrate data quality, collection, and analysis strategies.},
doi = {10.3791/57874},
journal = {Journal of Visualized Experiments},
number = 136,
volume = 2018,
place = {United States},
year = {2018},
month = {5}
}

Journal Article:
Free Publicly Available Full Text
Publisher's Version of Record

Citation Metrics:
Cited by: 2 works
Citation information provided by
Web of Science

Figures / Tables:

Figure 1 Figure 1: Moissanite sample (a) Moissanite sample embedded in epoxy puck. Three moissanite crystals can be optically identified. (b) Higher magnification microscope image of the region of interest. (c) X-ray fluorescence (XRF) map of the sample. The XRF measures all intensity from 2,000-20,000 eV. Since the Kα1 emission lines ofmore » Si and C are 1,740 and 277 eV, respectively, the moissanite sample can be identified by a lack of measured intensity.« less

Save / Share:
Figures/Tables have been extracted from DOE-funded journal article accepted manuscripts.