The impact of incorporating shell-corrections to energy loss in silicon
- Tsinghua Univ., Beijing (China). Key Lab. of Particle and Radiation Imaging and Dept. of Engineering Physics; Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Physics Division
- SLAC National Accelerator Lab., Menlo Park, CA (United States)
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Physics Division
Modern silicon tracking detectors based on hybrid or fully integrated CMOS technology are continuing to push to thinner sensors. The ionization energy loss fluctuations in very thin silicon sensors significantly deviates from the Landau distribution. Therefore, we have developed a charge deposition setup that implements the Bichsel straggling function, which accounts for shell-effects. This enhanced simulation is important for comparing with testbeam or collision data with thin sensors as demonstrated by reproducing more realistically the degraded position resolution compared with naïve ionization models based on simple Landau-like fluctuation. Our implementation of the Bichsel model agrees well with the multipurpose photo absorption ionization (PAI) model in Geant4 and is significantly faster. The code is made publicly available as part of the Allpix software package in order to facilitate predictions for new detector designs and comparisons with testbeam data.
- Research Organization:
- SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States); Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC); China Scholarship Council (CSC)
- Grant/Contract Number:
- AC02-76SF00515; AC02-05CH11231
- OSTI ID:
- 1461879
- Journal Information:
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment, Journal Name: Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment Journal Issue: C Vol. 899; ISSN 0168-9002
- Publisher:
- ElsevierCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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