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Title: Application of a Focused, Pulsed X-ray Beam for Total Ionizing Dose Testing of Bipolar Linear Integrated Circuits

Abstract

Here, we demonstrate the utility of focused, pulsed X-rays for investigating localized total ionizing dose effects in bipolar analog integrated circuits. Using the LM139 comparator as a test vehicle, we show how the technique can be used to identify the sources of degradation as a result of irradiating different transistors of the device and how this impacts the input bias current, input offset voltage, and output voltage. The 2-D mapping of the sensitive regions of transistors is presented, where the results of localized irradiation impact the monitored operational parameters.

Authors:
ORCiD logo [1];  [1];  [1]; ORCiD logo [1];  [1]; ORCiD logo [2]; ORCiD logo [3]; ORCiD logo [3];  [1];  [1];  [1];  [1]
  1. The Aerospace Corp., Los Angeles, CA (United States)
  2. Argonne National Lab. (ANL), Argonne, IL (United States)
  3. Vanderbilt Univ., Nashville, TN (United States)
Publication Date:
Research Org.:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1460728
Grant/Contract Number:  
AC02-06CH11357
Resource Type:
Accepted Manuscript
Journal Name:
IEEE Transactions on Nuclear Science
Additional Journal Information:
Journal Volume: 65; Journal Issue: 1; Journal ID: ISSN 0018-9499
Publisher:
IEEE
Country of Publication:
United States
Language:
English
Subject:
73 NUCLEAR PHYSICS AND RADIATION PHYSICS; analog integrated circuits; bipolar integrated circuits; radiation effects; synchrotron radiation; total ionizing dose; x-rays

Citation Formats

Lalumondiere, Stephen D., Dillingham, Erik C., Scofield, Adam C., Bonsall, Jeremy P., Karuza, Petras, Brewe, Dale L., Schrimpf, Ronald D., Sternberg, Andrew L., Wells, Nathan P., Cardoza, David M., Lotshaw, William T., and Moss, Steven C. Application of a Focused, Pulsed X-ray Beam for Total Ionizing Dose Testing of Bipolar Linear Integrated Circuits. United States: N. p., 2017. Web. doi:10.1109/tns.2017.2780827.
Lalumondiere, Stephen D., Dillingham, Erik C., Scofield, Adam C., Bonsall, Jeremy P., Karuza, Petras, Brewe, Dale L., Schrimpf, Ronald D., Sternberg, Andrew L., Wells, Nathan P., Cardoza, David M., Lotshaw, William T., & Moss, Steven C. Application of a Focused, Pulsed X-ray Beam for Total Ionizing Dose Testing of Bipolar Linear Integrated Circuits. United States. doi:10.1109/tns.2017.2780827.
Lalumondiere, Stephen D., Dillingham, Erik C., Scofield, Adam C., Bonsall, Jeremy P., Karuza, Petras, Brewe, Dale L., Schrimpf, Ronald D., Sternberg, Andrew L., Wells, Nathan P., Cardoza, David M., Lotshaw, William T., and Moss, Steven C. Thu . "Application of a Focused, Pulsed X-ray Beam for Total Ionizing Dose Testing of Bipolar Linear Integrated Circuits". United States. doi:10.1109/tns.2017.2780827. https://www.osti.gov/servlets/purl/1460728.
@article{osti_1460728,
title = {Application of a Focused, Pulsed X-ray Beam for Total Ionizing Dose Testing of Bipolar Linear Integrated Circuits},
author = {Lalumondiere, Stephen D. and Dillingham, Erik C. and Scofield, Adam C. and Bonsall, Jeremy P. and Karuza, Petras and Brewe, Dale L. and Schrimpf, Ronald D. and Sternberg, Andrew L. and Wells, Nathan P. and Cardoza, David M. and Lotshaw, William T. and Moss, Steven C.},
abstractNote = {Here, we demonstrate the utility of focused, pulsed X-rays for investigating localized total ionizing dose effects in bipolar analog integrated circuits. Using the LM139 comparator as a test vehicle, we show how the technique can be used to identify the sources of degradation as a result of irradiating different transistors of the device and how this impacts the input bias current, input offset voltage, and output voltage. The 2-D mapping of the sensitive regions of transistors is presented, where the results of localized irradiation impact the monitored operational parameters.},
doi = {10.1109/tns.2017.2780827},
journal = {IEEE Transactions on Nuclear Science},
number = 1,
volume = 65,
place = {United States},
year = {2017},
month = {12}
}

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